Inspecting form & finish in Ultra Precision Machining

Ultra-precision machining as manufacturing process produces components with extremely tight tolerances, achieving a srface super finish, with form accuracies typically in the sub-µm range and roughness in the (sub)nanometer range. UPM surfaces deliver properties that actively contribute to high-precision motion, automatic assembly or service life. Ultra-precision machining involves dedicated machining technology and tools, including inspection and quality control systems for reaching the super fine texture/ finish. 

The smaller the geometrical characteristics, the more challenging the inspection and processing. Optical surface metrology is steadily gaining importance for precision machining, diamond turning or single point diamond turning (SPDT). For face milling, grinding, lapping or polishing surfaces and ultraprecise roughness - inspect your results as machining feedback with Polytec whiltelight interferometers: either faster form measurements with large FOV, or more structural details with sub-nm resolution!

Highlights

  • Inspect large area form with µm accuracy, analyze roughness with nm-resolution
  • Fast and efficient areal measurements in production or inline
  • Capture large UP machined surfaces with FOV up to 230x220 mm
  • Large 70mm scan range reaches deep holes and recessed areas
  • Automatic pattern recognition enable multi-sample measurements w/o mechanical fixture
  • Smart Scanning Technology measures on all surfaces & materials (smooth & rough) 
Inspecting surface flatness, steps, angle and parallelism on the cuvette of a NIR spectroscope for ultra-precise alignment and positioning
Inspecting surface flatness, steps, angle and parallelism on the cuvette of a NIR spectroscope for ultra-precise alignment and positioning
Resolve ultra-precision machined surfaces with sub-nm precision, evaluate finish and areal roughness Sa, Sq, Sz
Resolve ultra-precision machined surfaces with sub-nm precision, evaluate finish and areal roughness Sa, Sq, Sz
Quality control of machined parts on production-level
Quality control of machined parts on production-level
Telecentric lens with 70mm large Z range reaches the insides of holes and deep steps
Telecentric lens with 70mm large Z range reaches the insides of holes and deep steps
Pass-fail analysis using surface metrology in a production line
Large image field and automatic pattern recognition allow multi-sample measurements in one shot - without manual positioning or fixture
Inspecting surface flatness, steps, angle and parallelism on the cuvette of a NIR spectroscope for ultra-precise alignment and positioning
Inspecting surface flatness, steps, angle and parallelism on the cuvette of a NIR spectroscope for ultra-precise alignment and positioning
Resolve ultra-precision machined surfaces with sub-nm precision, evaluate finish and areal roughness Sa, Sq, Sz
Resolve ultra-precision machined surfaces with sub-nm precision, evaluate finish and areal roughness Sa, Sq, Sz
Quality control of machined parts on production-level
Quality control of machined parts on production-level
Telecentric lens with 70mm large Z range reaches the insides of holes and deep steps
Telecentric lens with 70mm large Z range reaches the insides of holes and deep steps
Pass-fail analysis using surface metrology in a production line
Large image field and automatic pattern recognition allow multi-sample measurements in one shot - without manual positioning or fixture

Fast and efficient surface inspection with large field of view (FOV)

TopMap white-light interferometers measure form parameters and 3D topography on larger areas, bigger samples or even multiple samples without stitching. At production level, one-click testing solutions use predefined measurement recipes for a significant increase of testing efficiency, seizing the high speed and repeatability. For material research and inspecting the finish of ultra precision machined surfaces, microscope-based profilers investigate roughness parameters in the (sub)nanometer range!

TopMap profilers capture entire workpieces with a single image size of 44x33 mm without stitching. Expanded field-of-view based on image stitching reaches 230x220 mm areas. This configuration is great for measuring flatness, investigating parallelism and, with telecentric optical beam path and 70mm large vertical range, TopMap white-light interferometers safely measure bottom sections and of deep lying areas like drill holes. Non-contact areal scanning gathers over 2 million data points within just seconds in a single shot, perfectly visualizing the true shape, waviness or even producing material histograms. Using the integrated pattern recognition algorithms, the large field-of-view allows for multi-sample measurements without manual positioning, leading to significant time saving in testing especially on production level.

Capture areas with 230x220 mm extended field-of-view?

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Material ratio curve enabling the analysis of a flat lapped surfaces and a face milled surface
Comparing the material ratio curves of precision machined surfaces: Flat Lapping vs Face Milling
Material ratio curve: here split view into Peak, Core and Scoring sections by geometrical considerations
Material ratio curve: here split view into Peak, Core and Scoring sections by geometrical considerations
Ra, Rz roughness values as quality parameter? Differently machined surfaces might not always reveal different Ra, Rz parameters
Ra, Rz roughness values as quality parameter? Differently machined surfaces might not always reveal different Ra, Rz parameters
Quality control on grinding patterns, analyzing ground, lapped or polished surfaces
Quality control on grinding patterns, analyzing ground, lapped or polished surfaces
Material ratio curve enabling the analysis of a flat lapped surfaces and a face milled surface
Comparing the material ratio curves of precision machined surfaces: Flat Lapping vs Face Milling
Material ratio curve: here split view into Peak, Core and Scoring sections by geometrical considerations
Material ratio curve: here split view into Peak, Core and Scoring sections by geometrical considerations
Ra, Rz roughness values as quality parameter? Differently machined surfaces might not always reveal different Ra, Rz parameters
Ra, Rz roughness values as quality parameter? Differently machined surfaces might not always reveal different Ra, Rz parameters
Quality control on grinding patterns, analyzing ground, lapped or polished surfaces
Quality control on grinding patterns, analyzing ground, lapped or polished surfaces

Material distribution & material ratio curve

The performance of ultra-precision machined product surfaces can be modified and requirements can be optimized accordingly by characterizing the detailed material distribution. TopMap optical profilers capture surfaces quickly and precisely in lab and production. In some applications, increased friction brought about by distributing diamond particles on one surface can help to prevent the undesirable relative movement of touching surfaces. The desired level of friction is achieved by modifying the particle size, shape and quantity. TopMap 3D profilers help evaluate the detailed material distribution reliably.

Resolve (sub) nanometer steps?

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Inspecting tribological systems, analyzing e.g. the wear or volume as potential load capacity
Inspecting tribological systems, analyzing e.g. the wear or volume as potential load capacity

Tribology: Anticipating wear & tear

Optimize the mechanical loading capacity supported by precise surface characterization. Tribological system design requires very small surface parameter tolerances, while throughput must remain at a consistent and high level. To this end, TopMap white-light interferometers by Polytec offer non-contact tribology measurements with a high repetition rate to record the entire surface’s topography in a matter of seconds. Wear and tear studies are typical applications for TopMap surface metrology systems.

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