Unlock your potential in performance and quality
Our Metro.Lab white light interferometer is a compact optical measurement system that captures areal 3D topography with nanometer-level vertical performance (<2.85nm).
Telecentric optics maintain constant magnification and a safe working distance. With this technology, the Metro.Lab measurement system is ideally suited for measurement of flatness, step heights and parallelisms of large surfaces and structures even on soft and delicate materials—even in bores.
Recipe-driven software supports repeatable QA routines and reporting.
White-light interferometer for efficient quality inspection
Identify easily your yield and potential flaws
Single field 37 × 28 mm (~1.24 Mpts) with extended lateral coverage up to 87 × 78 mm; suitable for multiple parts and quick pass/fail checks.
In vertical (Z Axis), the specimen height can range from 0 to 70 mm.
Deep and hard-to-reach surface profiling
With the telecentric optics and a long working distance, Metro.Lab enables measurements near steep edges and into features like drilled holes, while keeping a safe gap to the part.
This is particularly helpful on macroscopic components with bores or recesses where conventional optics struggle.
Accuracy you need with a reproducibility you can trust
A 70 mm vertical measuring range handles large steps and form deviations, while nanometer-scale performance supports tight tolerances: <2.85 nm vertical resolution (phase evaluation).
The rugged design without moving parts demonstrates a very low measurement noise and high repeatability. In addition, a vibration damping system is integrated to measure with higher precision in rougher environments.
ISO compliant measurement with recipes and documentation
TMS enables recipe-based measurements for repeatable routines. Operators can start predefined sequences via barcode scan, with sample/recipe IDs logged automatically.
Evaluations follow DIN/ISO standards (e.g., ISO 25178, ISO 4287/4288). Results are visualized with clear pass/fail, and reports can be archived or exported to QS-STAT™ for SPC—supporting efficiency, repeatability, and traceability in lab or production.
Metrology tasks and visualizations
Below or some real-life results from standard tasks across common engineering materials. Those examples are gathered by our application centers which does feasibility studies and offers contractual measurement services.
Choose the right surface profiler with confidence—get a demonstration of our capabilities.
Compact WLI with telecentric lense and a wide Field of View (FoW)
The Metro.Lab platform combines large-area optics, long Z-range and ISO-aligned software for precise, repeatable measurements—even on recessed or delicate features.
- Broad Field of view (37 × 28 mm with stitching 87 × 78 mm) enable batch or large sample analysis
- Telecentric WLI/CSI (Michelson) avoids shadowing, enabling bore / flank measurements
- 70 mm Z-range vertical range with nanometer-level resolution
- Operator support with recipes and barcode scanner connectivity
Telecentric optics
Captures even low-lying measurement positions without shadowing.
Smart Scanning Technology
SST supports measurement of reflective or matte surfaces
Decoupled metrology
Integrated vibration damping for rugged measurements in rougher surroundings.
Large Field-of-View (FoV)
One-Shot measuring field of 37x28 mm. With stitching up to 87 x 78 mm.
Specimen positioning
Automate multiple measurement and stitching of large components up to 87 x 78 mm
Flexible vertical range
For specimen heights from 0 to 70 mm
The Metro.Lab capabilities in numbers
| Vertical range | 70mm |
| Step-Height Reproducibility (5µ – 5000µ) | 8% - 0.005% |
| Vertical resolution | 2.83 nm |
| Field of view (FoV) | 37 x 28 mm |
| FoV with stitching | 87 x 78 mm |
| XY pixels | 1284 x 966 |
| Digital XY sampling | 29.3 µm |
| Reproducibility | 20 nm |
| Flatness | <0.375 µm |
If you need more? Pro.Surf is your option.
Both Metro.Lab and Pro.Surf are macroscopic, telecentric WLI/CSI profilers with a 70 mm Z-range. The Pro.Surf line may be a better choice in case:
- Measuring components and batches are bigger
- A higher resolution and repeatability is demanded
- Form and roughness parameters have to be measured
- Higher throughput and tighter production integration is needed
In such cases, Pro.Surf maybe the better choices.
Related information and downloads
Flatness, thickness and parallelism
Flatness, thickness and parallelism (FTP) measurement combines top & bottom topography measurement in a single shot.
Surface roughness measurement
Surface texture analysis in 3D. From Sa/Sq to Str/Sal for validating specifications and surface features.
"Try before buy" offer
Measure, rent, decide - on your terms. Make a confident decision about which surface profiler fits into your metrology strategy and safeguard your capital investment.
Downloads
Discuss your demands with our experts
Let’s start with a short discussion about your parts, tolerances, and workflow — and, if useful, we can add a feasibility study, PolyMeasure (contract measurements), or a PolyRent trial as optional next steps.
