Measurement technologies for layer characterization
Wherever layer thickness needs to be determined, whether in the laboratory or through at-line or inline measurements, Polytec's measurement technologies for layer thickness measurement analyze without contact and are therefore completely non-destructive. The areas of application and possible uses for layer thickness measurements are as diverse as the range of measurement solutions offered by Polytec. Optical measurement systems are therefore used in numerous industries, such as automotive, electronics, mechanical engineering, the semiconductor industry, as well as research and development.
Product selection
Photothermal Measurement Systems
The Enovasense system measures thickness of opaque or transparent coatings extremely quickly in the laboratory and inline applications on almost all substrates. The compact measuring head is suitable for confined spaces.
Hyperspectral Imaging Measurement Systems
These systems use a unique combination of optical spectroscopy and imaging for precise surface analysis. Depending on the material properties, layer thicknesses can be measured non-destructively in an impressive range from 1 nm to 500 µm.
Terahertz Thickness Measurement Systems
Terahertz thickness measurement – fast, non-contact, non-destructive, ideal for multi-layers in industrial applications and process quality control.
Know-how & applications
Optical Coating Thickness Measurement: Methods Compared
Learn coating thickness measurement: compare optical and non-contact methods like photothermal and terahertz for precise inline analysis.
Optical coating thickness measurement
Industrial layer thickness applications – tailored to your materials, processes and production requirements.
Coatings and layer thickness
Coating quality control in 3D. Assessing pre-coat texture, post-coat defects, and film thickness.
