Measurement technologies for layer characterization
Wherever layer thickness needs to be determined, whether in the laboratory or through atline or inline measurements, Polytec's measurement technologies for layer thickness measurement analyze without contact and are therefore completely non-destructive. The areas of application and possible uses for layer thickness measurements are as diverse as the range of measurement solutions offered by Polytec. That is why optical measurement systems are used in numerous industries, such as automotive, electronics, mechanical engineering, the semiconductor industry, and research and development.






