Layer characterization

Measurement technologies for layer characterization 

Wherever layer thickness needs to be determined, whether in the laboratory or through at-line or inline measurements, Polytec's measurement technologies for layer thickness measurement analyze without contact and are therefore completely non-destructive. The areas of application and possible uses for layer thickness measurements are as diverse as the range of measurement solutions offered by Polytec.  Optical measurement systems are therefore used in numerous industries, such as automotive, electronics, mechanical engineering, the semiconductor industry, as well as research and development.

Wet or dry measurement of paints and powder coatings
Inline measurements
Inline measurements
Anodic oxide layer thickness measurement at narrow measuring points
Anodic oxide layer thickness measurement at narrow measuring points

Know-how & applications

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