Characterize your surface in 3D

Surface roughness masurement and measuring Ra, Rz roughness parameters
Surface roughness masurement and measuring Ra, Rz roughness parameters

Roughness

Roughness

Areal surface roughness measurement data provides an easy and complete view of an entire surface. In contrast, a profile measurement contains only a limited section of the entire surface and is less intuitive. Optical profilometers are increasingly replacing tactile measuring systems. Eventually in the near future, 2D parameters will only endure where their informative value is sufficient. A comprehensive and full 3D characterization of the entire sample surface e.g. by using optical surface metrology like TopMap whitelight intefereometers offers an intuitive visualization of measurement data while permiting extensive evaluation options for a deeper analysis and feedback on the production process.

Surface flatness measurement and parallellism as form parameter
Surface flatness measurement and parallellism as form parameter

Flatness

Flatness

Surface flatness tolerances are defined for many manufactured parts since flatness is crucial for many applications in order to ensure functionality of technical components. With flatness being an essential surface parameter, it influences e.g. the leakage of sealing surfaces on flanges and valve seats. In precision optics where optical polishing is applied, the flatness of e.g. glass substrates, optical mirrors or beam splitters is one of the most important quality indicators. But not only precision mechanics and optical components widely use flatness tolerances. In the electronics industry it is important to know whether the flatness of PCBs is within specified tolerances to ensure electrical connectivity when attaching multiple parts e.g. via soldering process. For surfaces that move relative to each other, surface flatness can also affect noise levels and sound emission of components. Simply put, flatness tolerances widely influence product reliability, functionality and even noise.

Measure step height, form parameter and 3D surface topography
Measure step height, form parameter and 3D surface topography

Step-height

Step-height

The inspection of step height plays an important role in quality inspection. For this reason, many technical drawings contain tolerance specifications for height dimensions, for example for shoulders, grooves and bores. If the specifications for step height are violated, disadvantageous gap dimensions occur or two component surfaces come into unintentional contact. This can lead to leakage at sealing surfaces, interrupted current flow at electrical contacts or increased frictional resistance and wear. In addition, the step height measurement can also be used to optimize build-up or ablation manufacturing processes; both the thickness of non-transparent layers can be determined and the material removal e. g. by laser pulses can be checked.

Analyze microstructure topography with nanometer resolution
Analyze microstructure topography with nanometer resolution

Microstructures

Microstructures

Using the versatile surface measurement systems from Polytec, you can complete your micro and nano technology tasks reliably, quickly and with a high level of precision. You can eject channel depths on your lab-on-a-chip, determine the step height on MEMS packaging, establish how flat pressure sensors are and analyze MEMS using surface parameters. Even performing dynamic out-of-plane and in-plane measurements on RF filters to determine MHz resonance frequencies will be a simple task.

Optical and areal step edge test showing a 75.2 nm thick coating
Optical and areal step edge test showing a 75.2 nm thick coating

Layer thickness

Layer thickness

The scratch test is a popular adhesion test for thin, hard and well-adhering coatings such as TiC (titanium carbide) on steel or cemented carbide substrates. Coating thickness measurement of non-transparent materials can also be measured at the edge of a coating or by a step-height measurement of the scratch. Layer thicknesses from a few μm upwards can be detected on transparent coatings at any position. 

A wide variety of surface defects in coating and metallizing can be measured, qualified and catalogued, including voids, streaks, chatter, droplets, spots, dimples, holes, scratches, coating disturbances, contaminants, orange peel, and visual texture appearance. Defects can be quickly visualized, measured and the information used to help identify its cause, so that process cures can be quickly implemented, optimized and then monitored to show the improvements in end coated surface quality control. Defects can be measured and qualified on a coating to help identify the cause.

Analyzing surface texture, measuring the 3D texturing with optical profilers with large field of view
Analyzing surface texture, measuring the 3D texturing with optical profilers with large field of view

Texture

Texture

Surface texture defines the topographical features of a workpiece surface, including characteristics such as roughness, waviness, and lay. These parameters may affect the performance, appearance, friction, corrosion resistance, fatigue behavior and thus the functionality of a component. So the surface texture influences a wide range of products, whether in industrial  machines and systems, medical devices or consumer goods. Surface texture is crucial throughout industries including manufacturing, automotive, aerospace, and electronics.

TopMap optical profilers provide 3D texturing measurement data based on precise height data by large areal scanning technique, enabling fast and repeatable measurements and reliable results.

Form, steps, roughness, optics or microstructures - measure it!

Non-contact 3D surface characterization

The characterization of precision-manufactured and functional surfaces requires measurement technology that is reliable, fast and precise. TopMap are innovative, high-precision and non-contact optical measurement systems that measure on rough, smooth and stepped surfaces. Topmap white-light interferometers are established optical quality inspection tools for laboratory, for production environments or in-line.

 

Whether form parameters and step-height with large FOV, or roughness and texture with sub-nm resolution - on precision mechanics, optics or microstructures - TopMap optical surface metrology measures it!

Specify your measurement task, ask for a free sample report

Technology guide: compare pros & cons of optical surface metrology approaches

Find out more about the strengths and limitations of these four common surface measurement methods in the technology comparison, regarding vertical and lateral resolution, application sweet spots on smooth surfaces or roughness measurement, with or w/o stitching

  • White-light interferometry 
  • Confocal microscopy 
  • Focus variation 
  • Chromatic confocal sensors 

Profilers with large FOV (44x33…230x220 mm) or sub-nm Z resolution

Characterize entire workpiece topographies in 3D  

Benefit from innovative, high-precision and non-contact measurement 

Use large vertical range, sub-nm resolution for clearest view 

Areal measurement with large field of view  

Reproducible measurement of surface flatness, step height, parallelism, roughness etc. 

From micro to macro size samples 

For labs, production level and in-line testing 

4 year warranty and lifetime software updates 

"Polytec provides excellent support in the development of stable measurement systems and standardized measurement processes."

Prof. Dr.-Ing. Jörg Seewig

TU Kaiserslautern

RnD engineer Raimund Rother from Hahn-Schickard about the role of whitelight-interferometry evaluating their lab-on-a-chip cartridge design
RnD engineer Raimund Rother from Hahn-Schickard about the role of whitelight-interferometry evaluating their lab-on-a-chip cartridge design

"With its high resolution, telecentric optics and high measurement speed, the white-light interferometer captures all details. Within a few seconds, it collects two million measurement points on an area 44 x 33 mm² without the need for stitching. The large field of view allows for measuring the entire chip at once. With the cartridge being transparent, we also obtain measurements from top and bottom simultaneously, indicating the exact thickness of the cartridge."

Raimund Rother

RnD Engineer from Hahn-Schickard

Dear visitor, in order to be able to watch our videos please accept the cookies. All information about the usage of cookies can be found in our privacy policy

Characterize your surface in 3D

Evaluate roughness, flatness, waviness, texture, step-height, parallelism and more. Measure your surfaces. Visualize valid data. Understand the topography.

Get a free sample report


Performance beyond metrology - our PolyXpert services

Surface metrology applications

In the compilation of articles "Surfaces in the right light", we have collected the most exciting, fascinating, inspiring application and technology stories for you.

Read more


Get a free sample report

1 Icon Envelope

Step 1:

Contact us to discuss your testing needs.

2 Icon Microscope

Step 2:

Ship your parts or visit us at one of our testing sites. Our application Xperts perform the measurement while you can join in person or online.

3 Icon Videocall

Step 3:

Get a detailed report and discuss your measurement data.

Areal optical measurement of a coating, revealing 10 μm wide and 2 μm deep defects

I have read and accept the data privacy policy.

Performance beyond metrology

Dear visitor, in order to be able to watch our videos please accept the cookies. All information about the usage of cookies can be found in our privacy policy

Powerful surface metrology and reliable quality inspections depend on know-how, on insights and on experts. Experience the new Micro.View® and Micro.View®+, the next generation of TopMap optical surface profilers.

Benefit from automated Focus Finder and Focus Tracker, Continuous Scanning Technology, 100 mm large vertical travel range and color information for enhanced surface analysis.

Explore more

Dear visitor, in order to be able to watch our videos please accept the cookies. All information about the usage of cookies can be found in our privacy policy

Industrial production benefits from tightly integrating surface metrology into the manufacturing process. Then, the inspection feedback allows immediate and cost-efficient reactions. TopMap surface metrology solutions from Polytec help adjusting manufacturing parameters, assure to stay within production tolerances and improve your process capability. 

Explore more

Dear visitor, in order to be able to watch our videos please accept the cookies. All information about the usage of cookies can be found in our privacy policy

See more details on rough, smooth and stepped surfaces. The TopMap Family of white-light interferometers are established inspection tools for the quality control laboratory, in manufacturing environments or in-line production setting.

Explore more

Powerful surface metrology and reliable quality inspections depend on know-how, insights and expertise. Quantify surface topography with sub-nanometer resolution and capture the finest details. Join us while we are implementing a soul into our TopMap profiler during development. 

Explore more

Industries

The design of a technical surface plays the key role for the functionality of the component. This applies equally to machine components as well as to medical products, the semiconductor industry and consumer goods of all kinds. As the link to the outside world, the surface of a workpiece affects many functional properties like sliding, wear resistance, sealing or the visual appearance. See, where surface metrology comes into play!   Explore all industries


Experience our service approach

 
 

About Polytec

For more than 50 years Polytec has been bringing light into the darkness. With nearly 500 employees worldwide we develop, produce and distribute optical measurement technology solutions for research and industry. Our quality innovative products have an excellent reputation internationally among the expert community. We find solutions tailored to our customers’ requirements.

Learn more about Polytec

Environmental commitment according to ISO 14001

We at Polytec proudly announce our certification according to both ISO 14001 and ISO 9001. These certifications reflect our strong commitment to quality and to our environmental responsibility – cornerstone of our continuous improvement process. Thanks to our team and external partners for their dedicated support!

See ISO 14001 certificate


Contact us

I have read and accepted the data privacy policy.

Contact your PolyXpert