Non-contact 3D surface characterization
The characterization of precision-manufactured and functional surfaces requires measurement technology that is reliable, fast and precise. TopMap are innovative, high-precision and non-contact optical measurement systems that measure on rough, smooth and stepped surfaces. Topmap white-light interferometers are established optical quality inspection tools for laboratory, for production environments or in-line.
Whether form parameters and step-height with large FOV, or roughness and texture with sub-nm resolution - on precision mechanics, optics or microstructures - TopMap optical surface metrology measures it!
Form, steps, roughness, optics or microstructures - measure it!
Specify your measurement task, ask for a free sample report
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Technology guide: compare pros & cons of optical surface metrology approaches
Find out more about the strengths and limitations of these four common surface measurement methods in the technology comparison, regarding vertical and lateral resolution, application sweet spots on smooth surfaces or roughness measurement, with or w/o stitching
- White-light interferometry
- Confocal microscopy
- Focus variation
- Chromatic confocal sensors
Profilers with large FOV (44x33 .. 230x 220mm) or sub-nm Z resolution?
Characterize entire workpiece topographies in 3D
Benefit from innovative, high-precision and non-contact measurement
Use large vertical range, sub-nm resolution for clearest view
Areal measurement with large field of view
Reproducible measurement of surface flatness, step height, parallelism, roughness etc.
From micro to macro size samples
For labs, production level and in-line testing
4 year warranty and lifetime software updates
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"Polytec provides excellent support in the development of stable measurement systems and standardized measurement processes."
![RnD engineer Raimund Rother from Hahn-Schickard about the role of whitelight-interferometry evaluating their lab-on-a-chip cartridge design RnD engineer Raimund Rother from Hahn-Schickard about the role of whitelight-interferometry evaluating their lab-on-a-chip cartridge design](/fileadmin/_processed_/2/3/csm_Raimund-Rother-rnd-engineer-loc-hahn-schickard_4d33eaa7d5.jpg)
"With its high resolution, telecentric optics and high measurement speed, the white-light interferometer captures all details. Within a few seconds, it collects two million measurement points on an area 44 x 33 mm² without the need for stitching. The large field of view allows for measuring the entire chip at once. With the cartridge being transparent, we also obtain measurements from top and bottom simultaneously, indicating the exact thickness of the cartridge." Raimund Rother, RnD Engineer from Hahn-Schickard
Characterize your surface in 3D
Evaluate roughness, flatness, waviness, texture, step-height, parallelism and more. Measure your surfaces. Visualize valid data. Understand the topography.
Performance beyond metrology - our PolyXpert services
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Surface metrology applications
In the compilation of articles "Surfaces in the right light", we have collected the most exciting, fascinating, inspiring application and technology stories for you.
Get a free sample report
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Step 1:
Contact us to discuss your testing needs.
![Icon Microscope](/fileadmin/_processed_/4/4/csm_Icons_sample_report_Step2_71c50ff2c9.png)
Step 2:
Ship your parts or visit us at one of our testing sites. Our application Xperts perform the measurement while you can join in person or online.
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Step 3:
Get a detailed report and discuss your measurement data.
![Areal optical measurement of a coating, revealing 10 μm wide and 2 μm deep defects Areal optical measurement of a coating, revealing 10 μm wide and 2 μm deep defects](/fileadmin/website/surface-metrology/image/surface-coating-defects-2um-depth.jpg)
Yellow element: Get sample - SQL form
Performance beyond metrology
Powerful surface metrology and reliable quality inspections depend on know-how, on insights and on experts. Experience the new Micro.View® and Micro.View®+, the next generation of TopMap optical surface profilers.
Benefit from automated Focus Finder and Focus Tracker, Continuous Scanning Technology, 100 mm large vertical travel range and color information for enhanced surface analysis.
Industrial production benefits from tightly integrating surface metrology into the manufacturing process. Then, the inspection feedback allows immediate and cost-efficient reactions. TopMap surface metrology solutions from Polytec help adjusting manufacturing parameters, assure to stay within production tolerances and improve your process capability.
See more details on rough, smooth and stepped surfaces. The TopMap Family of white-light interferometers are established inspection tools for the quality control laboratory, in manufacturing environments or in-line production setting.
Powerful surface metrology and reliable quality inspections depend on know-how, insights and expertise. Quantify surface topography with sub-nanometer resolution and capture the finest details. Join us while we are implementing a soul into our TopMap profiler during development.
Industries
The design of a technical surface plays the key role for the functionality of the component. This applies equally to machine components as well as to medical products, the semiconductor industry and consumer goods of all kinds. As the link to the outside world, the surface of a workpiece affects many functional properties like sliding, wear resistance, sealing or the visual appearance. See, where surface metrology comes into play! Explore all industries
Experience our service approach
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About Polytec
For more than 50 years Polytec has been bringing light into the darkness. With nearly 500 employees worldwide we develop, produce and distribute optical measurement technology solutions for research and industry. Our quality innovative products have an excellent reputation internationally among the expert community. We find solutions tailored to our customers’ requirements.
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