表面測量
光学轮廓术
在生产周期中测量表面的质量：非接触式，快速且准确
非接触式表面特征刻画
精密制造和机械的表面应具有同样可靠和高精度的表面测量技术。尺寸精度和功能，以及尽可能早的缺陷检测，可避免额外的成本，并提高整体产品质量以及使用寿命。
来自 Polytec 的 TopMap 系列的白光干涉仪是一种创新的、高度精确的、非接触性的工具, 用于刻画粗糙的、平滑的或分阶段的表面特征。TopMap 表面测量仪器在全球范围内用于实验室，生产环境甚至直接在生产线上的质量保证。
Xperts inside!
Powerful surface metrology and reliable quality inspections depend on know-how, on insights and on experts. The new Micro.View® and Micro.View®+ are the next generation optical surface profilers. Focus Finder and Focus Tracker greatly enhance the ease of use under all conditions. CST Continuous Scanning Technology allows for using the entire travel range of up to 100 mm as extended measurement range. Distinguish and document defects or visual distortions with the latest color information imaging analysis. Quantify surface topography with sub-nanometer resolution and capture the finest details. This expertise results in reliable surface quality control solutions.
