Measure 3D form, flatness or roughness? On glass, metal or dull ceramics?

Faster surface characterization - more reliable and efficient in 3D

For characterizing precision-manufactured and functional or sophisticated surfaces in detail and 3D, it requires measurement technology that is reliable, fast and precise. Guaranteeing functionality and detecting defects at an early stage avoids unnecessary cost and increases the overall product quality and lifetime. TopMap from Polytec addresses surface metrology applications with innovative, high-precision, non-contact optical technology that works on rough, smooth and stepped surfaces. White-light interferometers of the TopMap sensor family are established optical quality inspection tools for the controls laboratory, in production environments or in-line.

 

Whether form parameters and step-height with large FOV, or roughness and texture with sub-nm resolution - on precision mechanics, optics or microstructures - TopMap optical surface metrology measures it!


Profilers with large FOV (44x33 .. 230x 220mm) or sub-nm Z resolution?

Characterize entire workpiece topographies in 3D  

Benefit from innovative, high-precision and non-contact measurement 

Use large vertical range, sub-nm resolution for clearest view 

Areal measurement with large field of view  

Reproducible measurement of surface flatness, step height, parallelism, roughness etc. 

From micro to macro size samples 

For labs, production level and in-line testing 

4 year warranty and lifetime software updates 

No budget? Just measure.

Whether you need contract measurements, equipment rental, or leasing, our scalable services deliver precise data—without the overhead of major investments. Ideal for short-term projects, occasional use, or limited budgets. Get in touch with us—together we will find the right solution for your specific needs!

Find out more


Technology guide: compare pros & cons of optical surface metrology approaches

Find out more about the strengths and limitations of these four common surface measurement methods in the technology comparison, regarding vertical and lateral resolution, application sweet spots on smooth surfaces or roughness measurement, with or w/o stitching

  • White-light interferometry 
  • Confocal microscopy 
  • Focus variation 
  • Chromatic confocal sensors 

Performance beyond metrology

Environmental commitment according to ISO 14001

We at Polytec proudly announce our certification according to both ISO 14001 and ISO 9001. These certifications reflect our strong commitment to quality and to our environmental responsibility – cornerstone of our continuous improvement process. Thanks to our team and external partners for their dedicated support!

See ISO 14001 certificate