Non-contact 3D surface characterization

For characterizing precision-manufactured and functional or sophisticated surfaces in detail and 3D, it requires measurement technology that is reliable, fast and precise. Guaranteeing functionality and detecting defects at an early stage avoids unnecessary cost and increases the overall product quality and lifetime. TopMap from Polytec addresses surface metrology applications with innovative, high-precision, non-contact optical technology that works on rough, smooth and stepped surfaces. White-light interferometers of the TopMap sensor family are established optical quality inspection tools for the controls laboratory, in production environments or in-line.

 

Whether form parameters and step-height with large FOV, or roughness and texture with sub-nm resolution - on precision mechanics, optics or microstructures - TopMap optical surface metrology measures it!

Form, steps, roughness, optics or microstructures - measure it!

Specify your measurement task, ask for a free sample report

Technology guide: compare pros & cons of optical surface metrology approaches

Find out more about the strengths and limitations of these four common surface measurement methods in the technology comparison, regarding vertical and lateral resolution, application sweet spots on smooth surfaces or roughness measurement, with or w/o stitching

  • White-light interferometry 
  • Confocal microscopy 
  • Focus variation 
  • Chromatic confocal sensors 

Profilers with large FOV (44x33 .. 230x 220mm) or sub-nm Z resolution?

Environmental commitment according to ISO 14001

We at Polytec proudly announce our certification according to both ISO 14001 and ISO 9001. These certifications reflect our strong commitment to quality and to our environmental responsibility – cornerstone of our continuous improvement process. Thanks to our team and external partners for their dedicated support!

See ISO 14001 certificate