Reliable surface quality inspections and pass-fail analysis
The TopMap Pro.Surf quickly, reliably and precisely determines form deviation on a large field-of-view. TopMap Pro.Surf, the high-end solution, is ideal for measuring precision-made surfaces – in the metrology chamber, close to production or even right on the production line thanks to a high level of repeatability. The TopMap Pro.Surf offers the customized solution for all surface characterization requirements using parameters such as flatness, step heights and parallelism. All in all, the spatial resolution, the telecentric optics and the outstanding speed and performance cut a very impressive figure indeed.
outstanding single FoV
(extended 230 x 220 mm)
flexible, large Z range
high vertical resolution
warranty + lifetime software updates
Highlights
- Quick and precise 3D surface characterization
- Non-contact measurement and traceable results
- Capture large or multiple samples in one shot with exceptionally large workspace XYZ 230 x 220 x 70 mm
- SST Smart Scanning Technology + filter wheel master any surfaces, materials and reflectivities
- Telecentric lens measures even deep and recessed areas
- Safe sample handling thanks to a long stand-off distance
- Automatic sample recognition avoid mechanical fixture
- Free 4 year warranty and lifetime Software updates
Measure form, step-height & more of large samples
Polytec white-light interferometers measure and evaluate form parameters like fatness, parallelism, or step-height and waviness in 3D with nm resolution. TopMap Pro.Surf sees all surface details on large areas, making it fast and efficient for large samples or even multi-sample measurements. Capturing 2 million measurement points on a large 44 x 33 mm single measurement field within just seconds speed up your surface inspection. For a larger measurement field, extend by stitching to a 230 x 220 mm combined field of view. The exceptionally large 70 mm vertical measurement range (Z axis) plus excellent vertical resolution indipendent of the image field size offer plenty of freedom and workspace, adapting to your individual measuring needs. The telecentric optics with 70mm Z range reach hard-to-access and deep lying areas, such as drill holes and recessed surfaces.
Large area surface inspection lab and production
Pro.Surf also masters challenging production workflows with short measuring times for high throughput. Integrated machine vision tools like automatic pattern recognition speed up your quality control, avoiding mechanical fixture or positioning, allowing fast and efficient multi-sample measurements in a single shot on the large field of view (FOV). Ask for stage options, custom setups, software customization for defining own surface parameters, SDK tools or production-oriented measurement recipes as 1-click-solutions in order to make Pro.Surf your very own large area surface profiler.
Our PolXperts assist with measurement services and application support throughout all stages!
Pro.Surf large field-of-view surface measurements
Free guide on how to: Measurement System Analysis
Every measurement - whether with tactile or optical surface profilers - is subject to uncertainty. The measured values obtained are the basis for quality-controlled production and are thus a key component of quality assurance. However, the correctness of any conclusion drawn by a measurement depends not only on the suitability of the parameter, but also on how accurately and how reliably the measured values reflect the real conditions. Only if the measured value can be determined with a sufficiently small uncertainty in relation to the tolerance of the characteristic, the measurement process is suitable for the inspection task. This paper describes approaches and helpful capability figures of Measurement System Analysis (MSA).
Read in the free guide how to deal with measurement uncertainty for your Quality Assurance!
Optical Surface Metrology - See more details
Related products
TopMap Pro.Surf+
The multi-sensor profilometry system measures areal topography and form on an exceptionally large field-of-view (up to 230x220 mm) like common for Pro.Surf – while adding the chromatic-confocal sensor for complementary roughness line profile evaluation. Fast scanning, repeatable measurements for combined form & roughness characterization resolved in the nm range.
TopMap Micro.View
TopMap Micro.View® is an easy to use optical profiler in a compact table-top setup. Choose Micro.View® as the cost-effective inspection tool for examining precision-engineered surfaces down to the sub-nm range, for inspecting roughness, microstructures and more surface details. Custom objectives 0.6x to 111x and stage options allow for application-specific finetuning.
TopMap Micro.View+
TopMap Micro.View®+ is the next generation optical surface profiler in a modular design to measure challenging workpiece textures, surface finish and microstructures or MEMS with sub-nm resolution. Focus Finder and Focus Tracker assist in keeping samples focused at all times along the exceptionally large 100 mm Z range, with fully motorized positioning ready for both labs and automation. Challenge it now!
TopMap Metro.Lab
Start with areal surface and form characterization even with a smaller budget! TopMap Metro.Lab as complete and compact surface test station allows to examine large workpieces quickly, with reliable and repeatable results from shiny to rough surfaces.
Service & support
Free 3-year warranty on new gauges, outstanding service and reliable support: Our PolyXpert services comprise various packages: from on-site support to sensor integration and installation, we help find custom solutions, dedicated training, calibration or repair, plus our fast and uncompromising sensor exchange program. Our ProSpeed® optical length and speed sensors come along with a reliable partnership, know-how and trust! Proof us!