Table-top optical surface profiler
TopMap Micro.View is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. With an extended 100 mm Z measurement range and the CST Continuous Scanning Technology, Micro.View measures complex topographies at nm resolution. This convenient table-top setup features integrated electronics, with the smart focus finder simplifying and speeding up the measurement procedure.
Highlights
- Measure surface finish in a compact setup
- Non-contact measurement of 3D topography, roughness and texture
- 100 mm z measurement range with CST Continuous Scanning Technology
- Excellent lateral resolution
- Choose from application-specific objectives