Surface topography of optics, glass & transparent materials
Find efficient measurement and testing solutions for quality inspection of optics, glass or other transparent materials within the range of TopMap optical surface metrology. Optical profilers by Polytec are flexible and easy-to-use inspection systems for measuring thickness, determining form parameters like flatness, step-height or parallelism - fast and with nanometer precision. Polytec also offers custom solutions depending on your roughness, distance or thickness requirements. Benefit from high precisio with (sub)nanometer resolution data or large area scanning for covering larger samples or even multiple in one shot. Fast measurements meet high repeatability: In-line, on production level and in the lab.
- Measure lenses & mirrors
- Design Freeform optics
- Check Diffractive Optical Elements (DOE)
- Inspect laser & optical equipment etc.
Measure form, flatness & roughness on lenses, optics, mirrors
Measure surface form parameters, evaluate flatness or step-height on optical components, glass and transparent media. TopMap surface profilers allow for complete and fast inspections of lenses, optics, freeform optics or mirrors for design optimization and quality control in manufacturing. Transparent materials such as optics, mirrors, or lenses are challenging materials to measure due to its sensitivity to scratches or defects (tactile measurement) and reflectivity (optical measurement). Prevent from scratches or influences of tactile measurement tips by using non-contact optical measurement technology. The large area topography scanning of Polytec enables capturing entire workpieces or larger areas in one shot. The elaborated SST Smart Scanning Technology also copes with measuring different and challenging surface reflecitivies, providing reliable measurement performance on dull, matt, coated and shiny surfaces.
Typical optics inspection and measurement tasks
- Flatness measurement of mirrors
- Complete 3D characterization of lenses and freeform optics
- Warpage measurement on thin films or layers
- Layer thickness measurement
- Separated inspection of form, waviness and texture
- Roughness and microstructure analysis in sub-nm range
- Defect detection and evaluation related to scratch testing
- Step-height measurement on precision mechanics such as mirror or lens holders
- Form tolerance check of optical precision equipment (lasers, interferometers etc.)
- Combined measurement of Flatness-Thickness-Parallelism of top and bottom surface in one shot
Applications
- FTP Flatness thickness parallelism
![Flatness Thickness Parallelism combined direct topography measurement]( "Flatness Thickness Parallelism combined direct topography measurement")
Flatness Thickness Parallelism combined direct topography measurement - Optical polishing
![Optical polishing inspecting micro scratches and imperfections on optics and glass components]( "Optical polishing inspecting micro scratches and imperfections on optics and glass components")
Optical polishing inspecting micro scratches and imperfections on optics and glass components - Layer thickness
![Optical and areal step edge test showing a 75.2 nm thick coating]( "Optical and areal step edge test showing a 75.2 nm thick coating")
Optical and areal step edge test showing a 75.2 nm thick coating - Surface flatness
![Surface flatness measurement and parallellism as form parameter]( "Surface flatness measurement and parallellism as form parameter")
Surface flatness measurement and parallellism as form parameter - Surface step-height
![Measure step height, form parameter and 3D surface topography]( "Measure step height, form parameter and 3D surface topography")
Measure step height, form parameter and 3D surface topography
Related products
TopMap Micro.View
TopMap Micro.View® is an easy to use optical profiler in a compact table-top setup. Choose Micro.View® as the cost-effective inspection tool for examining precision-engineered surfaces down to the sub-nm range, for inspecting roughness, microstructures and more surface details. Custom objectives 0.6x to 111x and stage options allow for application-specific finetuning.
TopMap Micro.View+
TopMap Micro.View®+ is the next generation optical surface profiler in a modular design to measure challenging workpiece textures, surface finish and microstructures or MEMS with sub-nm resolution. Focus Finder and Focus Tracker assist in keeping samples focused at all times along the exceptionally large 100 mm Z range, with fully motorized positioning ready for both labs and automation. Challenge it now!
TopMap Pro.Surf
Pro.Surf stands for fast and professional 3D surface characterization: Capturing 2 million measurement points within seconds make sure to see every detail. Pro.Surf masters challenging production workflows with short measuring times. The exceptionally large field-of-view (FOV) 44x33 mm captures big samples or even multiple samples in a single shot - while stiching expands to 230x220 mm with the large 70 mm Z range for enhanced flexibility.