Next generation optical surface profiler 

TopMap Micro.View®+ is the next generation optical surface profiler. Designed for modularity, this comprehensive workstation allows for customized and application-specific configurations. The Micro.View®+ delivers the most detailed analysis of surface roughness, texture and microstructure topography. Combine 3D data with color information for amazing visualizations and extended analysis like detailed documentation of defects. The high-resolution 5 MP camera delivers incredibly detailed 3D data visualization of engineered surfaces.

Highlights

  • High-end white-light interferometer with nm resolution
  • 100 mm z measurement range with CST Continuous Scanning Technology
  • With Focus Finder and Focus Tracker ready for automation
  • Motorized X, Y, Z, tip/tilt and turret save repositioning
  • Color information mode for extended analysis and documentation of defects
  • Modular, application-specific configurations

Automation enabled and production-ready

The encoded and motorized turret secures a seamless transition between objectives. Micro.View®+ features the latest Focus Finder plus Focus Tracker, keeping the surface in focus at all circumstances. The fully motorized sample positioning stages allow for stitching and automation.

 

 

Your PolyXpert in Surface-Metrology