Find out which TopMap profiler is best suited for your measurement task
Find out which TopMap profiler is best suited for your measurement task

Surface profilers

Surface profilers from Polytec are high-precision optical measurement systems for non-contact, fast and efficient characterization of an entire workpiece topography, its form, roughness and structural details. The TopMap line of surface profilers is based on the principle of whitelight interferometry, also known as vertical or Coherence Scanning Interferometry (CSI) or coherence radar. With their large vertical range, nanometer resolution and the areal scanning of height data they precisely describe and visualize large samples or conduct multi-sample measurements speeding up quality control inline, at production level or in quality labs. TopMap surface profilers reliably measure surface parameters such as flatness, step height and parallelism and resolve microstructures with sub-nm resolution.

Whether compact table-top profiler, large FOV profiler, inline integrated profilers, advanced and modular or even custom profiler setups in ardware and custom parameters or add-ins (incl. SDK) - contact Polytyec!

Large FOV 33x44mm, 100mm Z range, configure your surface profiler!

Contact us
We guarantee all newly purchased TopMap systems for 4 years from date of delivery.
We guarantee all newly purchased TopMap systems for 4 years from date of delivery.
In Measurement System Analysis (MSA) the measurement uncertainty (b > a) leads to an increase in the observed process variation as well as in the areas at the tolerance limits in which no reliable decision can be made.
In Measurement System Analysis (MSA) the measurement uncertainty (b > a) leads to an increase in the observed process variation as well as in the areas at the tolerance limits in which no reliable decision can be made.
Based on n measured values x, the capability figures Cg and Cgk are determined providing a ratio between the tolerance T and the variation caused by the measurement equipment (standard deviation s)
Based on n measured values x, the capability figures Cg and Cgk are determined providing a ratio between the tolerance T and the variation caused by the measurement equipment (standard deviation s)
To determine the GRR value in Measurement System Analysis, several measurement objects are measured several times by several operators
To determine the GRR value in Measurement System Analysis, several measurement objects are measured several times by several operators
In Measurement System Analysis (MSA) the measurement uncertainty (b > a) leads to an increase in the observed process variation as well as in the areas at the tolerance limits in which no reliable decision can be made.
In Measurement System Analysis (MSA) the measurement uncertainty (b > a) leads to an increase in the observed process variation as well as in the areas at the tolerance limits in which no reliable decision can be made.
Based on n measured values x, the capability figures Cg and Cgk are determined providing a ratio between the tolerance T and the variation caused by the measurement equipment (standard deviation s)
Based on n measured values x, the capability figures Cg and Cgk are determined providing a ratio between the tolerance T and the variation caused by the measurement equipment (standard deviation s)
To determine the GRR value in Measurement System Analysis, several measurement objects are measured several times by several operators
To determine the GRR value in Measurement System Analysis, several measurement objects are measured several times by several operators

Free guide on how to: Measurement System Analysis

Every measurement - whether with tactile profiling or optical surface profilers - is subject to uncertainty. The measured values obtained are the basis for quality-controlled production and are thus a key component of quality assurance. However, the correctness of any conclusion drawn by a measurement depends not only on the suitability of the parameter, but also on how accurately and how reliably the measured values reflect the real conditions. Only if the measured value can be determined with a sufficiently small uncertainty in relation to the tolerance of the characteristic, the measurement process is suitable for the inspection task. This paper describes approaches and helpful capability figures of Measurement System Analysis (MSA) during your evaluation of optical VS tactile profilers.

Read in the free guide how to deal with measurement uncertainty for your Quality Assurance!

Stylus tip capturing a line profile VS optical profiler areal and large FOV topography
Stylus tip capturing a line profile VS optical profiler areal and large FOV topography
Inspecting surface defects and scratches produced by tactile profilers of nearly the same size 70 nm
Inspecting surface defects and scratches produced by tactile profilers of nearly the same size 70 nm

Optical profilers VS tactile stylus profilers

Feature & benefitOptical profilerTactile profiler (stylus)
Methodnon-contact, non-destructive, repeatable resultsinfluencing workpieces, abrasive, varying significance of data
Affordability by all userslimitedmost
Highly sensitive surfacesidealnot suited
Varying optical surface properties (reflectivity)little sensitiveno limits
Visualization of sampleintuitve, meaningful 3D data (WLI)simple profile line
Data collection per timehigh density on XYZlow

Contact your PolyXpert

+49 7243 604-2302
dms-info@polytec.de