Capturing HPLDs in a single pass
To guarantee that high-power laser diodes (HPLDs) will work reliably, it is important to check that the enclosure has the correct flatness and step height levels. To do this, you should use tried-and-tested technology that captures the smallest of height differences and that gives you measurement results reliably and quickly. We are, of course, talking about the surface measurement systems from Polytec.
TopMap optical 3D surface metrology systems allow the characterization of diodes in laser arrays in a large field-of-view and areal measurement, analyzign both the “smile” surface curvature and step heights directly on semiconductors. The large field of view captures all details in one measurement, leading to convenient, comprehensive and efficient inspections of the laser diodes’ enclosure without sacrificing high resolution.
Surface profiler for diodes and electronic components

Micro Profiler
Micro.View systems are optimized for ultra-high-resolution measurements in the sub-nanometer range. With focused optics and high vertical resolution they enable detailed analysis of microstructures, surface finish and material distribution where even the smallest deviations matter.

Macro Profiler
Pro.Surf systems enable fast, area-based 3D topography measurements with telecentric optics. They support reliable inspection of flatness, shape, parallelism and step heights across wide fields of view and in-bore features.

Metro.Lab
Metro.Lab is a compact, wide-area surface profiler. It combines high measurement performance with a small footprint—ideal for space or budget conscious applications that still require reliable 3D surface data.
Choose the right surface profiler with confidence—benefit from our "try before buy" approach.

Related applications and measurement tasks
Discuss your demands with our experts
Let’s start with a short discussion about your parts, tolerances, and workflow — and, if useful, we can add a feasibility study, PolyMeasure (contract measurements), or a PolyRent trial as optional next steps.






