Challenge and situation
HUBER+SUHNER manufactures high-precision micro-optical components such as thin-film filters, where highest quality is essential. These parts are very small, highly reflective and nominally flat — a combination that pushes conventional optical microscopy to its limits and makes their true surface geometry difficult to capture with standard tools. To safeguard the quality their customers rely on, HUBER+SUHNER needed a measurement method that could reliably resolve form and height on these challenging components.
The solution: white light interferometry with Micro.View
HUBER+SUHNER uses white light interferometry on the Polytec Micro.View to characterise these components without contact. A piezo-driven measurement head scans vertically and captures the interference pattern at each height step. From these slices, the software reconstructs the surface and translates the height information into a colour-coded topography map, resolving variations down to a few hundred nanometers — fine enough to reveal scratches and real surface detail that a microscope would miss.
The result
With non-contact white light interferometry on Micro.View, HUBER+SUHNER gains a fast, high-resolution 3D view of components that are otherwise too small, too flat and too reflective to measure conventionally. This supports their commitment to highest quality, delivering reliable surface and geometry data for confident quality control and deeper process understanding in micro-optical production.
The benefits of WLI explained by HUBER+SUHNER
Quick start into surface metrology
We take our claim Measure what matters seriously — and we support you in whatever way fits your situation. Even if your need is only temporary, or a full system isn’t in the budget yet, you have options: rent a system with PolyRent, or let our specialists run the measurements for you with PolyMeasure. And if you’re looking to buy, we’d recommend starting with a feasibility study or a rental — with the rental fee credited against your purchase price afterwards. Talk to our experts and we’ll recommend the best-fitting approach for your metrology tasks.