一次测量，获取上下两面形貌数据

工业零部件的功能和质量，依赖严格管控的加工流程。产线旁或在线质检，常借助表面计量技术评估工件的形状、粗糙度等参数。有时，为全面把控工件质量，对其正反两面进行综合检测不可或缺。

现在，Polytec 带来全新突破，单次面扫描测量，就能直接获取工件上下表面的综合形貌数据。

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工件前后表面 3D 形貌检测

FTP Flatness Thickness Parallelism concept: combined (areal) measurement in a single shot
FTP Flatness Thickness Parallelism concept: combined (areal) measurement in a single shot
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
FTP Flatness Thickness Parallelism concept: combined (areal) measurement in a single shot
FTP Flatness Thickness Parallelism concept: combined (areal) measurement in a single shot
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface
Capture parallelism and thickness of a sample, while also evaluating flatnesss of both back and front side of a surface

有时，要全面分析工件质量，对其正反两面开展综合检测必不可少。常规检测可能需翻转样本，借助额外参考面间接测量，或从正反两侧分别使用传感器。但这些方法都会增加测量误差。

全新 Polytec 的 FTP 测量模块，能快速、全面地同步测定平面度、厚度和平行度。这款可进行双面测量的 FTP 测量模块，有望革新精密机械加工领域的质量控制流程。在制表业，以及密封面、垫片环、光学元件等零部件的检测场景中，它都能大显身手。

Flipping or swapping the sample for A + B topography characterization
Flipping or swapping the sample for A + B topography characterization

样本翻转或换位操作

在某些情况下，需翻转被测样件才能测量正反两面。这类操作通常借助旋转装置完成，且校准流程十分复杂。Polytec 的 FTP 测量方案，无需旋转、翻转被测样件，免去额外校准步骤，让测量操作更高效、更简便。

 

一次测量，就能得出平面度、厚度和平行度数据

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Indirect measurement using an (imperfect) reference surface for flatness, thickness and parallelism measurement
Indirect measurement using an (imperfect) reference surface for flatness, thickness and parallelism measurement

间接测量与直接测量

在检测样件背面时，如果无法直接接触样件表面，就需要采用间接测量法，借助参考表面来获取样件背面特性。这类传统检测流程，不仅要对工件进行逐一测量，十分耗时，而且测量结果的准确性，还依赖于参考表面绝对理想这一前提。一旦参考表面存在误差，最终测量结果也会受到影响 。

FTP Flatness Thickness Parallelism point or line vs areal measurement (coherence scanning interferometry)
Point or line profile reveal limited insights compared to areal measurement using coherence scanning interferometry

线扫描与面扫描：数据密度的差异

在针对真实三维表面开展检测时，常见的单点测量和线轮廓测量，采集的测量点数量有限。这类方法不仅测量流程耗时，检测过程中，检测人员还必须在提升测量点密度和保障检测效率之间做出取舍。Polytec 的 FTP 综合测量方案运用非接触式测量技术，单次操作便能同时从上下两个视角，获取高数据密度的面测量数据，打破了传统测量方法的局限，实现了高效、精准的测量 。

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