表面測量學的若干訣竅
网络研讨会：轻松实现粗糙度测量
研讨会内容：从基于 ISO 21920 线粗糙度参数 Ra、Rq、Rz，到基于 ISO 25178 面粗糙度参数 Sa、Sq、Sz，更有实用技巧与方法…… 没时间参会？没关系 —— 立即注册观看回放！
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白光干涉儀
Introduction of the white light interferometry technology and the benefits for non-contact areal surface measurement.
形狀偏差與粗糙度
Characterize entire workpiece surfaces, calculate volume and exactly determine peaks and valleys on behalf of the examined distance parameters.
表面參數
Learn more about roughness, flatness, step-height and layer thickness.
ISO 21920 粗糙度
ISO 21920 is the new standard for mechanical engineering, design and roughness specifications
彩色共焦技術
色差共焦技術在表面計量學領域的應用簡介
表面測量技術專題報導於我們的Polytec雜誌：
相干扫描干涉测量技术（CSI）
了解相干掃描干涉儀（CSI）的光學技術如何分析地形、形狀與粗糙度，並與相關光學表面檢測方法相比，其優勢所在、最佳應用點及實際應用範疇。
光学抛光中的质量控制
光学抛光是一项专门为实现极低缺陷和光滑微观粗糙度而开发的制造工艺。 抛光是一种使用游离磨粒进行加工的过程，这些磨粒通常悬浮在液体（研磨液）中，而非像磨削那样固结在砂轮上。
专访阿尔贝特・韦肯曼教授：光学与接触式表面测量技术
我们与德国埃尔朗根 - 纽伦堡大学的阿尔贝特・韦肯曼教授进行了交流，探讨了接触式表面测量技术的局限性以及非接触式测量方法的应用前景。
Confirm flatness, roughness and step height – TopMap quality control on the factory floor
Consistently producing high-quality precision parts is better achieved when the supporting metrology is tightly integrated with the manufacturing process. By combining Polytec’s TopMap optical metrology wi…
Overview of optical methods for surface metrology
For applications where tactile surface measurement techniques have shortcomings, non-contact optical instruments have been developed to overcome these shortcomings. Especially with the development of compu…
How surface metrology reveals the finest forensic details
Forensic science plays a vital role in the criminal justice system by providing scientifically based information through the analysis of physical evidence. During an investigation, evidence is collected at…
For permanently high screw pre-tensioning force and optimum corrosion protection
The surface properties of coatings and paintwork play an important role in many products, as they have a significant impact on visual appearance, corrosion protection and resistance to physical damage. Inf…
