光学、玻璃和透明材料的表面形貌

在 TopMap 光学表面测量仪的范围内，为光学器件、玻璃或其他透明材料的质量检测找到高效的测量和测试解决方案。Polytec 的光学轮廓仪是灵活易用的检测系统，用于测量厚度，确定平面度、台阶高度或平行度等形状参数，速度快，精度高达纳米级。Polytec 还可根据您对粗糙度、距离或厚度的要求提供定制解决方案。利用（亚）纳米分辨率的高精度数据或大面积扫描覆盖较大的样品，甚至一次扫描多个样品，都能让您受益匪浅。测量速度快，重复性高： 在线、生产级和实验室。

  • 测量透镜和反射镜
  • 设计自由曲面光学器件
  • 检查衍射光学元件 (DOE)
  • 检查激光和光学设备等
Fast and complete 3D topography measurement of optics, lenses, freeform optics providing large area and high resolution data
Fast and complete 3D topography measurement of optics, lenses, freeform optics providing large area and high resolution data
3D characterization of polynomial freeform
3D characterization of polynomial freeform
High resolution topography data of optics, here of a micro prism array
High resolution topography data of optics, here of a micro prism array
Scratch and defect detection on optics and lenses, evaluating areal roughness Sa, Sq, Sz instead of Ra, Rq, Rz
Scratch and defect detection on optics and lenses, evaluating areal roughness Sa, Sq, Sz instead of Ra, Rq, Rz
Characterizing small details and microstructures with sub-nanometer resolution; sample data of an optical polished surface
Characterizing small details and microstructures with sub-nanometer resolution; sample data of an optical polished surface
Detailed analysis of a DOE Diffractive Optical Element in a 3D profile
Detailed analysis of a DOE Diffractive Optical Element in a 3D profile
Flatness evaluation of multiple layers of glass
Flatness evaluation of multiple layers of glass
Topography measurement result of a glass surface evaluating flatness
Topography measurement result of a glass surface evaluating flatness
Surface profilers deliver in-process feedback of machining, such as grinding, polishing of optics/ lenses and precision mechanics
Surface profilers deliver in-process feedback of machining, such as grinding, polishing of optics/ lenses and precision mechanics
Surface flatness evaluation of precision mechanics for optical instruments
Surface flatness evaluation of precision mechanics for optical instruments
Fast and complete 3D topography measurement of optics, lenses, freeform optics providing large area and high resolution data
Fast and complete 3D topography measurement of optics, lenses, freeform optics providing large area and high resolution data
3D characterization of polynomial freeform
3D characterization of polynomial freeform
High resolution topography data of optics, here of a micro prism array
High resolution topography data of optics, here of a micro prism array
Scratch and defect detection on optics and lenses, evaluating areal roughness Sa, Sq, Sz instead of Ra, Rq, Rz
Scratch and defect detection on optics and lenses, evaluating areal roughness Sa, Sq, Sz instead of Ra, Rq, Rz
Characterizing small details and microstructures with sub-nanometer resolution; sample data of an optical polished surface
Characterizing small details and microstructures with sub-nanometer resolution; sample data of an optical polished surface
Detailed analysis of a DOE Diffractive Optical Element in a 3D profile
Detailed analysis of a DOE Diffractive Optical Element in a 3D profile
Flatness evaluation of multiple layers of glass
Flatness evaluation of multiple layers of glass
Topography measurement result of a glass surface evaluating flatness
Topography measurement result of a glass surface evaluating flatness
Surface profilers deliver in-process feedback of machining, such as grinding, polishing of optics/ lenses and precision mechanics
Surface profilers deliver in-process feedback of machining, such as grinding, polishing of optics/ lenses and precision mechanics
Surface flatness evaluation of precision mechanics for optical instruments
Surface flatness evaluation of precision mechanics for optical instruments

测量透镜、光学器件和反射镜的形状、平面度和粗糙度

测量表面形状参数，评估光学元件、玻璃和透明介质的平面度或台阶高度。TopMap 表面轮廓仪可对透镜、光学器件、自由曲面光学器件或反射镜进行全面而快速的检测，以便在制造过程中进行设计优化和质量控制。由于对划痕或缺陷（触觉测量）和反射率（光学测量）的敏感性，光学器件、镜子或透镜等透明材料是极具挑战性的测量材料。使用非接触式光学测量技术可防止触觉测量尖端受到划痕或影响。Polytec 的大面积形貌扫描可一次扫描整个工件或更大的区域。精心设计的 SST 智能扫描技术还可以测量不同的、具有挑战性的表面反射率，为暗淡、无光泽、涂层和光亮表面提供可靠的测量性能。

TopMap 光学剖面仪的典型光学应用包括

  • 镜面平面度测量
  • 透镜和自由曲面光学器件的完整 3D 表征
  • 薄膜或层翘曲测量
  • 层厚度测量
  • 形状、波纹和纹理的单独检测
  • 亚纳米范围内的粗糙度和微结构分析
  • 与划痕测试相关的缺陷检测和评估
  • 镜架或透镜架等精密机械的台阶高度测量
  • 光学精密设备（激光器、干涉仪等）的形状公差检查
  • 一次测量上下表面的平面度、厚度和平行度
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