PSV QTec - Reinventing full-field vibration mapping
The new PSV QTec Scanning Vibrometers make full-field vibration measurements up to 10 times faster. The patented QTec® multi-path interferometry eliminates the influence of rough technical surfaces on the signal quality and therefore measures reliably on all surfaces with low noise.
For measuring the finest details in surfaces by areally characterizing form parameters without contact, the TopMap optical profilers are the preferred solution. From microscope to macroscope quality control applications, Polytec offers turnkey surface metrology solutions for industry and research.
Visit Polytec around the world at trade fairs and conferences, or sign up to one of our online seminars, user meetings or customer seminars to find out more about the principles, advantages and various uses of optical measuring technologies!