Micro-to-macro surface profiling

Measure microscopic surface structures and large areas without losing detail with a large variety of lenses and unmatched True Stitching quality for wider samples or trays. 

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Utilize lense variety to get the right details 

High magnifications are ideal for roughness and microstructure analysis, while lower magnifications allow measurement of larger surface features and micro-form deviations.

Micro.View for example offers a  magnifications range from 111× to 0.6× enableing engineers to transition smoothly between:

  • surface roughness measurement
  • surface texture characterization
  • micro-form analysis

This allows the same system to capture microscopic surface structures and larger surface features without changing measurement technology.

In case you need a specific magnification only for a specific project and a dedicated time you can use PolyRent to rent the lense for the time needed.

Analyze samples beyond the Field of View (FoV)

Even with optimized optics, some samples are simply larger than the measurement field of view. In these cases, the surface is measured tile by tile, and the individual measurements are combined into a complete dataset.

The metrology quality of such large-area measurements depends on the optics and sensing technology, the needed number of tiles and the stitching algorithms. 

With our wide Field of View and our advanced algorithm we can ensure high measurement quality even at tile boundaries, resulting in:

  • seamless transitions between tiles
  • accurate overall surface geometry
  • reliable surface characterization across large areas
  • high-fidelity, large-area measurements by minimizing stitching artifacts 

Tip: We recommend to run feasibility studies or rent a device to validate the measurement results as the stitching quality varies dramatically between manufactures. Please contact us, if you would like to see by yourselves how well True Stitching outperforms the market.

Surface measurement tasks often require both high resolution and wide coverage.
With micro.view optical profilers, engineers can analyze surfaces across multiple scales — from roughness and microstructures to larger surface features and micro-form deviations.

Key benefits

  • Micro-to-macro measurements with magnifications from 111x to 0.6x
  • High-resolution roughness and surface texture analysis
  • Seamless large-area measurements with True Stitching
  • Compliant to industry standards