Measuring Reflection and Attenuation Events in Optical Fibers
Measuring reflection and attenuation events along a fiber link using OTDR (Optical Time Domain Reflectometry) is a fundamental task during the installation, commissioning, and maintenance of optical networks. As such, compact and portable OTDRs are essential tools for every installer or service technician. When the highest resolution is required, an OFDR (Optical Frequency Domain Reflectometer) is the only alternative.
Product selection
PalmOTDRs
Polytec's PalmOTDRs combine compact size, low weight, and affordable pricing with professional-grade performance. The devices feature a color display with a German-language user interface and are ready for operation within just 5 seconds.
Measurements are initiated with a single button press, as the device automatically optimizes all necessary settings.
After completing a measurement series, the data can be easily transferred via USB to the included Trace Manager software for detailed analysis and documentation.
Key Features of the PalmOTDRs:
- Wavelengths: 850/1300 nm (Multi-mode); 1310/1490/1550/1625/1650 nm (Single-mode)
- Dynamic range: up to 50 dB
- Large memory: stores up to 1200 measurement traces (.sqr format)
- Battery life: 8 hours of continuous operation
- Weight: 1 kg
- Trace Manager software for analysis and reporting
- Available in FTTx-optimized models
OFDRs
Based on the OFDR principle, the precision reflectometers of the OBR series offer the highest spatial resolution available in a compact, portable device worldwide. With this instrument, you can accurately locate and measure reflection and attenuation events with exceptional precision. Thanks to the absence of a dead zone, the measurement starts directly at the device connector.
These systems are ideal for fault detection and analysis in connectors, components, cassettes, and short-range networks up to 2 km.
| OBR 6225 | |
| Datasheet | PDF Download |
| Wavelength Range | 1547 nm |
| Maximum Measurement Range | 100 m |
| Spatial Resolution | 80 µm over 20 m 100 µm over 50 m 200 µm over 100 m |
| Measurement Parameters | IL, RL |
| Spectral Information | Yes |
| Application Areas | Field, Laboratory, Production |