Passive optical component characterization
With solutions ranging from comprehensive vector analyzers to high-performance parameter testers, Luna’s solutions for optical component testing can help you gain insight and validate new designs or optimize your products. Test and characterize modern optical components, including photonic integrated circuits (PICs) and silicon photonics, with unmatched speed, precision and accuracy. Accelerate and improve your design or optimize your production with OVAs and LWAs.
Optical Vector Analyzer OVA 5100
The OVA’s measurement parameters: IL, PDL, RL, GD, CD, PMD (first and second order), phase response, impulse response, complex Jones matrix elements, phase ripple
- Wavelength range: 1,525–1,610 nm
- Spectral resolution: 1.6 pm
- Dynamics (IL): up to 80 dB
- Measuring time: 1 s (real-time mode), 55 s (precision mode)
Models
- OVA 5100
- Complete characterization according to amplitude and phase-dependent parameters for C and L band
- OVA 5113
- Complete characterization according to amplitude and phase-dependent parameters for O band
Software packages
- Desktop Analysis Software
- Software providing all of the analysis and data visualization of the OVA 5100, using only saved OVA measurement data files.
- Polarisation Analysis Software
- Analyzes response to simulated input polarization states.
- OFDR Option
- Optical Frequency Domain Reflectometer (OFDR) software for performing high-resolution reflectometry measurements.
Light wave analyzer
LWA 7000
The LWA 7601-C Lightwave Component Analyzer is a fast and simple-to-use tool for testing modern optical components and modules. The system utilizes optical frequency domain reflectometry (OFDR) technology to measure backscattered or transmitted light as a function of distance/time (or wavelength). The extremely high sensitivity and sampling resolution (20 μm) make an ideal analyzer for PICs and silicon photonics. When combined with the extended measurement range, up to 500 m measurement range is achieved, making the testing of fiber networks an easy task. The LWA 7601-C reduces the cost and complexity of test while increasing throughput by measuring RL, IL and length in reflection or transmission with a single instrument.
Key features
- Return loss (RL) & insertion loss (IL) analysis
- Analyze components in reflection & transmission
- Trace distributed RL over length of optical path
- Spectral analysis of RL & IL
- Detect and precisely locate reflective events and measure path length
- up to 500 m
- Speed, resolution and accuracy
- for optimizing production test
- 20 μm sampling resolution
- 12 Hz scan/ acquisition rate
- (80 ms)