We look forward to presenting our metrology solutions to you at Optatec:
At our booth, we will be showcasing our modular "Micro.View" product family. It combines optical interferometry with microscopy optics to solve a wide range of surface metrology tasks.
- High-resolution surface roughness and structural details with maximum precision thanks to CSI (Coherence Scanning Interferometry) and True Stitching.
- Repeatable and reliable quality control with Focus Finder, Focus Tracker, and recipe management.
- Flexible adaptation to various sample sizes and materials with CST (Continuous Scanning Technology), True Stitching, and a wide selection of objectives (0.6X to 111X).
- For lab and production environments with patented ECT (Environmental Compensation Technology) for reliable results despite external interference.
The resulting precision, robustness, and flexibility make the Micro.View an excellent choice for applications in precision engineering, optics and optical components, semiconductors and microelectronics, MEMS and microsystems, materials research, and tribology – in both laboratory and production-oriented environments.
You can find us as a co-exhibitor at the Nanotechnology Competence Center (UPOB) joint booth in Hall 3.0, #503.
Unable to visit Optatec but interested in our technology? Register for our next webinar:
Find more information about the event here.