製錶師仰賴CSI相干掃描干涉儀技術來實現精密調校
鐘錶零件的表面品質取決於CSI相干掃描干涉儀（亦稱白光干涉儀）的測量精度與重複性。此技術可檢測鐘錶元件的幾何公差，量測形狀參數如平整度、平行度或台階高度。
TopMap 區域掃描白光干涉儀能為微型零件提供快速、完整且高解析度的測量數據。相較於其他光學測量技術（如條紋投影或焦點變化法），TopMap 光學輪廓儀無論在粗糙表面或光學平滑表面上皆能實現可靠測量！
表面輪廓儀
微型分析儀
Micro.View systems are optimized for ultra-high-resolution measurements in the sub-nanometer range. With focused optics and high vertical resolution they enable detailed analysis of microstructures, surface finish and material distribution where even the smallest deviations matter.
巨觀分析器
Pro.Surf systems enable fast, area-based 3D topography measurements with telecentric optics. They support reliable inspection of flatness, shape, parallelism and step heights across wide fields of view and in-bore features.
Metro.Lab
Metro.Lab是一款紧凑型广域表面轮廓仪。它将卓越的测量性能与小巧的占地面积完美结合，特别适用于空间或预算受限但仍需可靠3D表面数据的应用场景。
選擇合適的表面處理方案，請放心選用轮廓仪 ——透過我們的「先試用後購買」方案，讓您輕鬆獲益。
相關應用與測量任務
超精密加工
Surface metrology for precision and ultraprecision mechanics, form precision measurement in µm, areal roughness accuracy in (sub)nanometer range.
形狀偏差與粗糙度
Characterize entire workpiece surfaces, calculate volume and exactly determine peaks and valleys on behalf of the examined distance parameters.
