The TMS Software for Polytecs topography measurement systems (TMS) of the TopMap series offers a wide range of features and options for quick and easy routine measurements but also for your extensive and detailed surface analysis:
- Interference Finder automatically detects your surface under test
- Smart Surface Scanning technology enables measurements on surfaces with different reflection and contrast properties
- Work with masks, profiles and layers
- Evaluation in terms of many different 2D and 3D surface parameters
- Multitude of exportable characteristic values according to e.g. QS-Stat
- Creation of a task-specific user interface with application-specific add-ins
- Geometric evaluation options for sphere matching and for determination of step heights, layer thicknesses and volume
- Expanded maximum lateral measurement area by faster assembling of several measurements (stitching)
- Expanded reporting option sent results
The TopMap "measurement recipe" concept significantly simplifies the definition of acquisition settings (e.g. measurement position, illumination settings, camera parameters) and its evaluation parameters (post-processing steps, visualization possibilities, export options) for any specific measurement task. Especially in manufacturing environments, the TopMap recipes turn comprehensive surface analysis into simple one-click tasks.
- Compensates reflectivities for measuring on nearly all surfaces
- Automatic processing with predefined "measurement recipes"
- Comprehensive evaluations with a multitude of 2D and 3D surface parameters