Flexible solutions for four-point measurements
Polytec offers a wide range of manual probe stands for non-automated four-point measurements, with the selection depending on the size and shape of the samples, as well as the available space. Here, you will find a selection of available solutions.
Product selection
Polytec offers the Multiheight Probe Stand as a solution for a variety of measurements. The probe head can be raised and lowered, allowing for the measurement of samples with different thicknesses, from thin layers to large ingots.
The Multiheight stand comes with 4 mounting holes in the base, which can accommodate optional accessories such as an 8-inch wafer table or an X-Y micropositioning stage.
| Max. Sample Size | Diameter up to 250 mm (300 mm diameter available as an option at no extra cost) |
|---|---|
| Max. Sample Thickness | Heights of up to 250 mm can be measured (greater thicknesses available upon request) |
| Microswitch | Prevents current flow when the probe is not in contact with the sample |
| Manual Control | Simple lever operation for inserting and removing the probe head |
| Easy Setup | A single cable connects the stand to the measurement electronics |
| Mounting Holes | Optional sample tables are available |
Polytec offers the Microposition Stand as a solution for measurements on small samples or printed lines, where the micro-fine positioning of the probe head is crucial. The maximum sample size is 76 mm. The micrometer movement allows a maximum range of 25 mm x 25 mm in 0.01 mm increments and 360-degree rotation of the sample.
| Max. Sample Size | Up to 76 mm diameter |
|---|---|
| Max. Sample Thickness | Up to 4 mm thickness |
| Microswitch | Prevents current flow when the probe head is not in contact with the sample |
| Manual Control | Simple lever operation for inserting and removing the probe head |
| Easy Setup | A single cable connects the stand to the measurement electronics |
| Micrometer Stage | 25 mm x 25 mm with 0.01 mm increments |
Polytec offers the Hand Sensor as a solution for highly flexible, mobile measurements. The holder fully rests on the samples during measurement, preventing measurement fluctuations that can occur with handheld methods.
The holder can be used to measure a variety of samples, from thin films and wafers to large ingots. The probe head can be loaded with up to 200 g per needle, and the holder has a weight of approximately 1.2 kg to ensure proper contact of the needles. Sensitive, unsupported samples are unsuitable for this method.
| Max. Sample Size | Any common sample size can be measured, as long as the holder can be positioned accordingly |
|---|---|
| Max. Sample Thickness | Any common sample thickness can be measured, as long as the holder can be positioned accordingly |
| Toggle Switch | Prevents current flow when the probe head is not in contact with the sample |
| Manual Placement | The holder is designed to be placed and held during the measurement, preventing fluctuations usually associated with handheld measurements |
| Easy Setup | A single cable connects the holder to the measurement electronics |