Form and position tolerances in precision components
When manufacturing components, increasingly tight production tolerances must be met — particularly on technical and functional precision surfaces. Manufacturers therefore need to verify form tolerances such as waviness or flatness, as well as position tolerances such as parallelism and tilt, with high accuracy. This ensures compliance with specifications and reliable delivery within defined timeframes.
In many cases, manufacturers inspect the complete surface topography of a component to verify compliance with form and position tolerances — for example in shock absorber components, other precision parts in the automotive and aerospace industries, or in fine mechanics.
Verifying form and position tolerances
White-light interferometry enables fast and highly precise analysis of ceramic components, imprints, security features, and even forensic evidence. Requirements for component warpage (e.g., printed circuit boards) also continue to increase as geometries shrink.
In addition, many applications involve challenging geometries: measurement surfaces may be located deep inside bores or show significant height differences between functional areas. Here, Polytec systems based on proven white-light interferometry deliver reliable results — even where other optical measurement methods reach their limits.
Polytec white-light interferometers perform repeatable, non-destructive measurements with resolutions of only a few nanometers — and even sub-nanometer capability. Optical profilers are ideally suited for the precise determination of form parameters such as flatness and parallelism — supporting efficient verification and easy integration into inline inspection workflows for form and position tolerances.
Optical profilers for tolerance verification
Polytec provides optical systems for measuring the topography of large surfaces with nanometer-level vertical resolution. This high vertical resolution is independent of the field of view, enabling stable measurement results across different sample sizes and inspection setups. Typical measurement tasks include determining flatness, step height, roughness, parallelism, and other surface parameters required to comply with form and position tolerances.
マイクロプロファイラー
Micro.View systems are optimized for ultra-high-resolution measurements in the sub-nanometer range. With focused optics and high vertical resolution they enable detailed analysis of microstructures, surface finish and material distribution where even the smallest deviations matter.
マクロプロファイラ
Pro.Surf systems enable fast, area-based 3D topography measurements with telecentric optics. They support reliable inspection of flatness, shape, parallelism and step heights across wide fields of view and in-bore features.
Metro.Lab
Metro.Lab is a compact, wide-area bench-top surface profiler. It combines high measurement performance with a small footprint — ideal for space- or budget-conscious applications that still require reliable 3D surface data.
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「購入前に試す」キャンペーン
Measure, rent, decide - on your terms. Make a confident decision about which surface profiler fits to your metrology strategy and safeguard your capital investment
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まずは部品仕様、公差、ワークフローについて簡単に話し合いましょう。必要に応じて、実現可能性調査、PolyMeasure（契約測定）、またはPolyRentトライアルをオプションの次のステップとして追加することも可能です。
