We are very pleased to present our measurement technology solutions to you at preXcon: At our exhibition stand, we will be showing you our modular product family "Micro.View". This combines optical interferometry with microscope optics in order to solve a variety of tasks in the field of surface metrology.
- High-resolution surface roughness and structural details with the highest precision thanks to CSI Coherence Scanning Interferometry and True Stitching
- Repeatable and reliable quality control with Focus Finder, Focus Tracker and recipe management
- Flexible adaptation to different sample sizes and materials with CST Continuous Scanning Technology, True Stitching and a wide selection of objectives (0.6X .. 111X)
- In the laboratory and production with patented ECT Environmental Compensation Technology for reliable results despite disturbing influences
The resulting precision, robustness and flexibility make the Micro.View an excellent choice for applications in the fields of precision engineering, optics and optical components, semiconductors and microelectronics, MEMS and microsystems, materials research and tribology – both in laboratory and production-oriented environments.
You can find further informations here.