ISO 21920：该标准对粗糙度测量的意义

ISO 21920 是机械工程、设计和粗糙度规范方面的新标准。Polytec 将带您了解这项新标准的制定动机，它对日常粗糙度和形状测量的影响，ISO 21920 三个部分的含义，以及在质量控制中的应用方法。

ISO 21920 是粗糙度轮廓测定的核心规则，取代了部分沿用数十年的旧标准，实现了标准的迭代升级 。

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High-resolution roughness measurement <1nm; sample data of a polished silicon surface
High-resolution roughness measurement <1nm; sample data of a polished silicon surface
ISO-21920 & ISO 25178 - Sa, Sz, Sq instead of Ra, Rz, Rq - Areal roughness measurement
Sa, Sz, Sq instead of Ra, Rz, Rq - Areal roughness measurement
ISO 21920 - measuring roughness and surface form on precision parts
Measuring roughness and surface form on precision parts
Surface roughness measurement with cross section on organic material like leather for automotive interior parts
Surface roughness measurement with cross section on organic material like leather for automotive interior parts
Micro roughness with cross section of a wafer surface
Micro roughness with cross section of a wafer surface
High-resolution roughness measurement <1nm; sample data of a polished silicon surface
High-resolution roughness measurement <1nm; sample data of a polished silicon surface
ISO-21920 & ISO 25178 - Sa, Sz, Sq instead of Ra, Rz, Rq - Areal roughness measurement
Sa, Sz, Sq instead of Ra, Rz, Rq - Areal roughness measurement
ISO 21920 - measuring roughness and surface form on precision parts
Measuring roughness and surface form on precision parts
Surface roughness measurement with cross section on organic material like leather for automotive interior parts
Surface roughness measurement with cross section on organic material like leather for automotive interior parts
Micro roughness with cross section of a wafer surface
Micro roughness with cross section of a wafer surface

表面粗糙度与光洁度因应用场景而异

机械加工时，不仅要符合几何规格（如精确控制零部件尺寸），满足形状和位置公差要求（如确定孔的位置），表面质量对产品功能及长期性能也极为关键。无论是传统机械工程，还是电子、半导体、光学元件领域，均是如此。因应用场景不同，表面粗糙度要求相差几个数量级，范围从小于 1  nm 到几 μm  。

 

如何使用 Polytec 白光干涉仪测量表面粗糙度

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Roughness measurement example in different scales from µm to nm
Roughness measurement example in different scales from µm to nm

粗糙度理念 ——ISO 21920 标准

如之前案例所示，“粗糙度” 是一个抽象概念，不同人基于自身视角和预期，对其理解可能存在差异。欢迎报名或联系我们，参加粗糙度主题网络研讨会。会上，我们将对粗糙度基本概念展开讲解，助力大家达成统一认知。

ISO 21920 - Surface described as superposition of waves - roughness as a question of wavelength
Surface described as superposition of waves - roughness as a question of wavelength
ISO 21920 - Roughness of a surface depending on the filtering (nesting index)
Roughness of a surface depending on the filtering (nesting index)
ISO 21920 - Surface described as superposition of waves - roughness as a question of wavelength
Surface described as superposition of waves - roughness as a question of wavelength
ISO 21920 - Roughness of a surface depending on the filtering (nesting index)
Roughness of a surface depending on the filtering (nesting index)

ISO 21920：构建粗糙度统一规范

ISO 21920 标准化旨在消除粗糙度规范解读的歧义，让设计部门和质量控制部门等沟通更清晰。 ISO 21920 对以下三项做出规定：

  • 如何在图纸上标注
  • 参数如何计算
  • 如何对参数进行测量
Free guide on ISO 21920 - form and roughness evaluation
Free guide on ISO 21920 - form and roughness evaluation

下载免费的 ISO 21920 指南

免费 ISO 21920 指南中的表格直观清晰，为您展示：

  • 测量与评估设定：Sc1 至 Sc5 设置类别如何确定粗糙度测量、评估设置，涵盖 S 滤波器和 L 滤波器设置、取样长度、评定长度
     
  • 参数详情：各设置类别的具体参数
     
  • 术语对照：ISO 21920 术语，被替代的旧术语，以及相应的翻译术语
Content structure of the three-part ISO 21920 standard
Content structure of the three-part ISO 21920 standard

SO 21920 轮廓测定标准的架构

ISO 21920 属于轮廓测定标准，共包含三个部分

  • 表面粗糙度规定：替代 ISO 1302
  • 术语和参数：涵盖嵌套指数、R 轮廓、Ra、Rz 等，替代 ISO 4238、ISO 13565-2 与 ISO 13565-3
  • 规范操作规定：替代 ISO 4288

 

部分术语和参数参考自 2012 年首次发布的表面标准 ISO 25178。多数情况下，表面粗糙度测量相较基于轮廓的粗糙度测量优势明显。表面粗糙度光学面扫描测量采用光学非接触式技术，一键就能生成完整的表面图像。在无法确定所测特定轮廓能否代表工件整个表面时，这种测量方法优势尽显 。

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