TopMap Micro.View® is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. With an extended 100 mm Z measurement range and the CST Continuous Scanning Technology, Micro.View® measures complex topographies at nm resolution. This convenient table-top setup features integrated electronics, with the smart focus finder simplifying and speeding up the measurement procedure.
- Measure surface finish in a compact setup
- Non-contact measurement of 3D topography, roughness and texture
- 100 mm z measurement range with CST Continuous Scanning Technology
- Excellent lateral resolution
- Choose from application-specific objectives
Small footprint with expanded capability
Benefit from the optional ECT Environmental Compensation Technology, securing reliable and accurate measurement results even in noisy and challenging production environments. Micro.View® is the cost-effective quality control instrument for inspecting precision engineered surfaces in both manufacturing and research.
Precision measurement is about experience, about expertise and about experts and technology we trust in. Take a look behind the scenes, learn more about the development and about the people behind TopMap and meet the PolyXperts. Come join our journey!