Measurement technologies for layer characterization
Wherever layer thickness needs to be determined, whether in the laboratory or through atline or inline measurements, Polytec's measurement technologies for layer thickness measurement analyze without contact and are therefore completely non-destructive. The areas of application and possible uses for layer thickness measurements are as diverse as the range of measurement solutions offered by Polytec. That is why optical measurement systems are used in numerous industries, such as automotive, electronics, mechanical engineering, the semiconductor industry, and research and development.
Product selection
Photothermal Measurement Systems
The Enovasense system measures thickness of opaque or transparent coatings extremely quickly in the laboratory and inline applications on almost all substrates. The compact measuring head is suitable for confined spaces.
Terahertz Thickness Measurement Systems
Terahertz thickness measurement – fast, non-contact, non-destructive, ideal for multi-layers in industrial applications and process quality control.
Hyperspectral Imaging Measurement Systems
These systems use a unique combination of optical spectroscopy and imaging for precise surface analysis. Depending on the material properties, layer thicknesses can be measured non-destructively in an impressive range from 1 nm to 500 µm.
