Optical 3D surface metrology solutions

Polytec offers complete solutions for quality inspections of precision engineered surfaces. Optical 3D surface profilers from Polytec are innovative, high-precision and non-contact measurement systems for characterizing entire workpiece topographies in 3D. Based on the principle of white-light interferometry, also known as coherent or vertical scanning interferometry or coherence radar, Polytec surface metrology solutions impress with a large vertical range, nanometer resolution and areal measurement with a large field of view. 3D surface metrology solutions from Polytec are ideal for reliable and reproducible measurement of surface flatness, step height and parallelism on large sample structures – on almost every material.

Free guide on how to: Measurement System Analysis

Every measurement - whether with tactile or optical surface profilers - is subject to uncertainty. The measured values obtained are the basis for quality-controlled production and are thus a key component of quality assurance. However, the correctness of any conclusion drawn by a measurement depends not only on the suitability of the parameter, but also on how accurately and how reliably the measured values reflect the real conditions. Only if the measured value can be determined with a sufficiently small uncertainty in relation to the tolerance of the characteristic, the measurement process is suitable for the inspection task. This paper describes approaches and helpful capability figures of Measurement System Analysis (MSA).

Read in the free guide how to deal with measurement uncertainty for your Quality Assurance!