Optical 3D surface metrology solutions

Polytec offers complete solutions for quality inspections of precision engineered surfaces. Optical 3D surface profilers from Polytec are innovative, high-precision and non-contact measurement systems for characterizing entire workpiece topographies in 3D. Based on the principle of white-light interferometry, also known as coherent or vertical scanning interferometry or coherence radar, Polytec surface metrology solutions impress with a large vertical range, nanometer resolution and areal measurement with a large field of view. 3D surface metrology solutions from Polytec are ideal for reliable and reproducible measurement of surface flatness, step height and parallelism on large sample structures – on almost every material.


TopMap family

Surface metrology in a new dimension