Polytec enhances its Micro.View line of optical surface profilers with a new motorized sample stage, featuring a 100 mm lateral translation plus motorized tip & tilt capability: Handling larger samples and expanding the measurement area with True Stitching has never been that easy and reproducible in a table-top setup.
The 100 mm XY stage upgrades the compact models of the TopMap product line into a complete surface test station for automated 2D /3D inspections of roughness, texture, finish, microstructures, scratches and defects or form parameters resolved at sub-nm level.
The compact setup of this white-light interferometer seizes the entire 100 mm lateral travel, while True Stitching algorithms secure smooth sampling for reliable data even on the edges beyond the field of view.
With enhanced tilt speed and the advanced Focus Finder and Focus Tracker plus auto-centering, this optical roughness tester delivers repeatable measurements, professionalizing and speeding up any testing lab and quality control.
Users may choose from various objectives 2.5X, 10x .. 111x, including low reflecting and bright field options. Especially the unique 0.6x lens expands testing capabilities from classic microscopic topography to larger form and topography measurements with expanded field of view to 15.53 x 11.71 mm².
With the new sample stage, the TopMap Micro.View becomes the ideal solution for measuring larger surfaces faster. Cover precision mechanics or electronics the size of an 4“ wafer, test microsytem arrays, or automate tray measurements for multi-sample inspections.
www.polytec.com/topmap
Technical Specifications
| XY Stage | |
| XY range | 100 x 100 mm² |
| Max. XY velocity | 10 mm/s |
| Tip Tilt module | |
| Max tip tilt angle | ±2.5° motorized |
| Max. sample weight | 5 kg |
| Max. tilt velocity | 2.5 °/s |
| Angular resolution | 0,02 arcsec |
| Complementary software options |
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