Optical 3D surface profilers 

Optical 3D surface profilers from Polytec are innovative, high-precision and non-contact tools for characterizing the surface topography in 3D. They are based on the principle of white-light interferometry, which is also known as coherent or vertical scanning interferometry or coherence radar. Thanks to their large vertical range, nanometer resolution and areal measurement, they are perfect for contactlessly measuring the flatness, step height and parallelism of large sample structures – on almost every material.

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