Our new patented QTec® multipath technology eliminates the influence of the surface on the signal quality and therefore measures reliably on all materials. Contact us for a demo! We offer testing services in one of our labs or on-site at your facility, a short-term rental, leasing or acquiring one of our products, our experienced experts are trained to find the best technical solution for you.
New IR capability for dynamic characterization of encapsulated MEMS devices
Dynamic response measurements are critical for validating MEMS designs. Polytec extends this capability for measuring through the silicon caps of packaged devices (ex. Inertial Sensors). Our latest MSA-650 IRIS Micro System Analyzer uses unique IR technology to measure response of packaged devices in their operating form.
Our new generation of Polytec optical profilers for measuring roughness, waviness, step heights, and other surface parameters has arrived. Polytec now offers a wide range of advanced instruments for R&D and in-line quality control applications in industrial environment covering applications from large object profilometry to microscopic roughness and texture analysis.
Visit Polytec around the world at trade fairs and conferences, or sign up to one of our online seminars, user meetings or customer seminars to find out more about the principles, advantages and various uses of optical measuring technologies!