Optical 3D surface metrology

No budget? Just measure.

Whether you need contract measurements, equipment rental, or leasing, our scalable services deliver precise data—without the overhead of major investments. Ideal for short-term projects, occasional use, or limited budgets. Get in touch with us—together we will find the right solution for your specific needs!

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Measure form, steps, roughness and characterize yuor workpiece- FREE STUDY!

What surface measurement task is yours?

For characterizing precision-manufactured and functional or sophisticated surfaces in detail and 3D, it requires measurement technology that is reliable, fast and precise. Guaranteeing functionality and detecting defects at an early stage avoids unnecessary cost and increases the overall product quality and lifetime. TopMap from Polytec addresses surface metrology applications with innovative, high-precision, non-contact optical technology that works on rough, smooth and stepped surfaces. White-light interferometers of the TopMap sensor family are established optical quality inspection tools for the controls laboratory, in production environments or in-line.

Whether form parameters and step-height with large FOV, roughness and texture with sub-nm resolution - on precision mechanics, optics or microstructures - measure it with TopMap optical surface metrology!

Applications of optical surface metrology

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How to: Measurement System Analysis

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How to: Roughness evaluation according to ISO 21920

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How to: Technology comparison of optical surface metrology

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Form, steps, roughness, optics or microstructures - measure it!

Analyzing surface texture, measuring the 3D texturing with optical profilers with large field of view

Surface texture

The surface texture or finish defines a workpiece topography regarding its roughness, waviness, and lay parameters. The particular 3D texturing of a precision surface affects its appearance, friction, corrosion resistance and more. Regarding ISO 4287, ISO 25178 or the new 3-part ISO 21920 - TopMap surface profilers acquire millions of data points for areal evaluation within just seconds.

Surface roughness masurement and measuring Ra, Rz roughness parameters

Surface roughness

Surface roughness measurement with TopMap white-light interferometers provides millions of data points wihtin seconds, enabling repeatable and reliable roughness analysis. Ra, Rz... vs Sa Sz? Polytec offers 3D roughness profilers, both areal and line profilometry for roughness evaluation according to ISO 25178-1, -2, -3 and ISO 4287, 4288 and ISO 3274 and more. Send your sample for a free feasibility study and test how fast the areal and optical roughness analysis works.

TopMap Micro.View(+)

Micro.View^® and its big brother Micro.View^®+ are the next generation optical surface profilers. Focus Finder and Focus Tracker greatly enhance the ease of use. CST Continuous Scanning Technology turns 100mm travel range into full measurement range. Distinguish and document defects reliably with the Color Information mode. Quantify surface topography with sub-nm resolution and reliably characterize precision mechanics, sealing surfaces, MEMS or microstructures with excellent vertical resolution independent of the magnification.

Surface flatness measurement and parallellism as form parameter

Surface flatness

Measure surface flatness and characterize workpiece topography regarding surface flatness tolerances according to ISO 1101, ISO 12781 using fast and areal optical profilers

Flatness Thickness Parallelism combined direct topography measurement

FTP Flatness thickness parallelism

The new Polytec FTP Flatness, Thickness and Parallelism measuring module represents the fast and comprehensive measurement solution for evaluating flatness, thickness and parallelism at once. The FTP measuring module for back and front measurements can become a game-changer in quality control of precision mechanics such as in the watch-making industry, for sealing surfaces, shim rings or optical components and more.

TopMap Pro.Surf topography measurement instrument for evaluating surface parameters with large FOV

TopMap Pro.Surf

Pro.Surf stands for fast and professional 3D surface characterization: Capturing 2 million measurement points within seconds make sure to see every detail. Pro.Surf masters challenging production workflows with short measuring times. The exceptionally large field-of-view (FOV) 33x44 mm captures big samples or even multiple samples in a single shot - while stiching expands to 230x220 mm with the large 70 mm Z range for enhanced flexibility.

Technology guide optical surface metrology

Technology comparison in optical surface metrology

Technology guide: compare pros & cons of optical surface metrology approaches

Find out more about the strengths and limitations of these four common surface measurement methods in the technology comparison, regarding vertical and lateral resolution, application sweet spots on smooth surfaces or roughness measurement, with or w/o stitching