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TopMap profilers: hardware, optics, software & service

Polytec offers complete optical surface metrology solutions for quality inspections of engineered surfaces and form evaluation – whether flatness or step-height on CNC-machined precision parts, warpage and form on smooth optics, or texture, finish or MEMS and microstructure analysis. 

We build the most reliable white-light interferometers, backed by application service and know-how, 4 years of warranty and a lifetime free software updates

Our profilers measure non-contact and promise precise and repeatable measurements. Benefit from the extraordinary large vertical range and high Z resolution, and the impressive Field-of-View (FOV) even allowing multi-sample measurements. Whether fast scanning of large samples or thorough texture and roughness analysis with sub-nm resolution – challenge the TopMap profilers and test for free!

Free guide on how to: Measurement System Analysis

Every measurement - whether with tactile or optical surface profilers - is subject to uncertainty. The measured values obtained are the basis for quality-controlled production and are thus a key component of quality assurance. However, the correctness of any conclusion drawn by a measurement depends not only on the suitability of the parameter, but also on how accurately and how reliably the measured values reflect the real conditions. Only if the measured value can be determined with a sufficiently small uncertainty in relation to the tolerance of the characteristic, the measurement process is suitable for the inspection task. This paper describes approaches and helpful capability figures of Measurement System Analysis (MSA).

Read in the free guide how to deal with measurement uncertainty for your Quality Assurance!

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