From surface metrology to comprehensive topgraphy analysis

The TMS Software for Polytecs topography measurement systems (TMS) of the TopMap series offers a wide range of features and options for quick and easy routine measurements but also for your extensive and detailed surface analysis:

  • Interference Finder automatically detects your surface under test
  • Smart Surface Scanning technology enables measurements on surfaces with different reflection and contrast properties
  • Work with masks, profiles and layers
  • Evaluation in terms of many different 2D and 3D surface parameters
  • Multitude of exportable characteristic values according to e.g. QS-Stat
  • Creation of a task-specific user interface with application-specific add-ins
  • Geometric evaluation options for sphere matching and for determination of step heights, layer thicknesses and volume
  • Expanded maximum lateral measurement area by faster assembling of several measurements (stitching)
  • Expanded reporting option sent results

 

The TopMap "measurement recipe" concept significantly simplifies the definition of acquisition settings (e.g. measurement position, illumination settings, camera parameters) and its evaluation parameters (post-processing steps, visualization possibilities, export options) for any specific measurement task. Especially in manufacturing environments, the TopMap recipes turn comprehensive surface analysis into simple one-click tasks.

Download

Download and install our service tool Polytec Update to receive the latest software.

Highlights

  • Compensates reflectivities for measuring on nearly all surfaces
  • Automatic processing with predefined "measurement recipes"
  • Comprehensive evaluations with a multitude of 2D and 3D surface parameters

Your PolyXpert in Surface-Metrology