Surface characterization with white-light interferometry
The TopMap Metro.Lab from Polytec is a high-precision white-light interferometer (coherence scanning interferometer) with a large vertical range and nanometer resolution. This means the Metro.Lab topography measurement system is ideally suited to the non-contact measurement of flatness, step heights and parallelisms of large surfaces and structures even on soft and delicate materials.
Being a complete measuring station, the TopMap Metro.Lab is the optimum solution when you want to measure large-area topographies on almost all surfaces. The large vertical measurement range of 70 mm allows you to perform measurements with subnanometer resolution, even under difficult conditions.
Since it offers great value for money, the TopMap Metro.Lab is particularly attractive to use, whether you’re working in the metrology lab or close to production. It handles many tasks that you would previously have used tactile systems for. As with all TopMap systems, the open software architecture also enables you to program routine tasks or set up your very own user interface.
Optical surface metrology - see more details
The TopMap In.Line’s compact design means it can be easily integrated into the production line and quickly carries out checks on differently reflective surfaces. Steps, larger ripples or other surface structures do not pose any problems here.
Ideal for quick and precise 3D surface characterization. The areal measurement ensures that no details are overlooked. Short measuring times and a large field-of-view characterize the TopMap Pro.Surf®.
The all-in-one 3D optical surface profiler from Polytec. The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. Pro.Surf®+ measures topography over a...