Capturing HPLDs in a single pass

To guarantee that high-power laser diodes (HPLDs) will work reliably, it is important to check that the enclosure has the correct flatness and step height levels. To do this, you should use tried-and-tested technology that captures the smallest of height differences and that gives you measurement results reliably and quickly. We are, of course, talking about the surface measurement systems from Polytec. TopMap optical 3D surface metrology systems allow the characterization of diodes in laser arrays in a large field-of-view and areal measurement, analyzign both the “smile” surface curvature and step heights directly on semiconductors. The large field of view captures all details in one measurement, leading to convenient, comprehensive and efficient inspections of the laser diodes’ enclosure without sacrificing high resolution.

Your PolyXpert in Surface-Metrology