Microscopic surface characterization sub-nm resolution
With the TopMap µ.Lab measuring microscoope, you characterize microstructure surfaces with a very high lateral resolution. This optical profilometer determines parameters such as texture, flatness, ripple and roughness on both fine and sensitive structures, microstructures and MEMS. The Polytec Smart Surface Scanning technology even measures areas of a surface with different reflectivities.
Optical measuring microsope for surface analysis
Individual images are stitched together with ease using an optional, motorized XY positioning stage. It is even possible to develop application-specific lenses depending on requirements, such as longer stand-off distances or glass compensation.
The all-in-one 3D optical surface profiler from Polytec. The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. Pro.Surf+ measures topography over a...