Table-top optical surface profiler
TopMap Micro.View is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. With an extended 100 mm Z measurement range and the CST Continuous Scanning Technology, Micro.View measures complex topographies at nm resolution. This convenient table-top setup features integrated electronics, with the smart focus finder simplifying and speeding up the measurement procedure.
Small footprint with expanded capability
Benefit from the optional ECT Environmental Compensation Technology, securing reliable and accurate measurement results even in noisy and challenging production environments. Micro.View is the cost-effective quality control instrument for inspecting precision engineered surfaces in both manufacturing and research.
Xperts inside! Next generation optical surface metrology
Especially for close-to-manufacturing applications where multiple samples are handled, the software module QC Operator Interface guides the operator and greatly simplifies quality control (QC) of precision surfaces.
A whole new package of smart features for quality control (QC) tasks are now available for the TopMap 3D surface profiling systems - the TopMap QC Package supports surface inspections especially in challenging production environments.
The TMS Software for Polytecs topography measurement systems of the TopMap series offers a wide range of features and options for quick and easy routine measurements but also for your extensive and detailed surface analysis.
TopMap Micro.View is an easy to use and compact optical profiler. Choose Micro.View as the cost-effective quality control solution for surface analysis of precision-engineering, for inspecting roughness, microstructures and more surface details.
The all-in-one 3D optical surface profiler from Polytec. The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. Pro.Surf®+ measures topography over a...