Surface metrology systems

White-light interferometers are the ideal solution for precision inspections of functional surfaces with high quality standards. Our TopMap surface metrology systems characterize surfaces reliably in the research lab, close to and in production lines. Our different TopMap models are desigend for quality inspections under challenging conditions.

TopMap QC Package

A whole new package of smart features for quality control (QC) tasks are now available for the TopMap 3D surface profiling systems - the TopMap QC Package supports surface inspections especially in challenging production environments.

TopMap Metro.Lab

Being a complete measuring station, the TopMap Metro.Lab is ideally suited to large-area topographies on almost all surfaces. Since it offers great value for money, it is also attractive for smaller companies with fewer tasks.

TopMap In.Line

The TopMap In.Line’s compact design means it can be easily integrated into the production line and quickly carries out checks on differently reflective surfaces. Steps, larger ripples or other surface structures do not pose any problems here.

TopMap Pro.Surf

Ideal for quick and precise 3D surface characterization. The areal measurement ensures that no details are overlooked. Short measuring times and a large field-of-view characterize the TopMap Pro.Surf.

TopMap Pro.Surf+

The all-in-one 3D optical surface profiler from Polytec. The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. Pro.Surf+ measures topography over a large area and, in so doing, characterizes structures with nanometer resolution.

TopMap µ.Lab

With the TopMap µ.Lab measuring microscoope, you characterize microstructure surfaces with a very high lateral resolution. This optical profilometer determines parameters such as texture, flatness, ripple and roughness on both fine and sensitive structures, microstructures and MEMS.