Advanced automation features for optical profilers: Introducing Micro.View and Micro.View+ for surface metrology

11:00 AM PST

Join us for a webinar on our TopMap surface metrology products and TMS software automation options, with a special introduction to the latest additions to the portfolio, Micro.View and Micro.View+ optical profilers. The TopMap family of tools are ideal solutions for roughness, flatness, step-height and much more in an array of industrial and research applications. We present the unique operator interface in conjunction with a bar-code scanner for a ‘one-click’ solution when deploying metrology in the production/manufacturing setting.

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