TMS-1200 TopMap µ.Lab

Microscope System with Subnanometer Resolution

Microscope System with Subnanometer Resolution

With the TMS-1200 TopMap µ.Lab, you can characterize microstructures’ surfaces with a very high lateral resolution. The optical profilometer contactlessly determines parameters such as texture, flatness, ripple and roughness on both fine and sensitive structures. The Polytec Smart Surface scanning technology even measures areas of a surface with different reflectivities.

Individual images are stitched together with ease using an optional, motorized XY positioning stage. It is even possible to develop application-specific lenses depending on requirements, such as longer stand-off distances or glass compensation.

Optical Surface Metrology - See more details

Related areas of applications Surface Metrology

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