Microscope System with Subnanometer Resolution
With the TMS-1200 TopMap µ.Lab, you can characterize microstructures’ surfaces with a very high lateral resolution. The optical profilometer contactlessly determines parameters such as texture, flatness, ripple and roughness on both fine and sensitive structures. The Polytec Smart Surface scanning technology even measures areas of a surface with different reflectivities.
Individual images are stitched together with ease using an optional, motorized XY positioning stage. It is even possible to develop application-specific lenses depending on requirements, such as longer stand-off distances or glass compensation.
Optical Surface Metrology - See more details
The new all-in-one system from Polytec. The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. Pro.Surf+ measures topography over a large area and, in...
Polytec’s configurable, chromatic confocal sensors of the TopSens series enable fast quality inspections in-line.