Polytec’s optical surface metrology range includes innovative, high-precision and non-contact tools. They are based on the principle of white-light interferometry, which is also known as coherent or vertical scanning interferometry or coherence radar. Thanks to their large vertical range and nanometer resolution, they are perfect for contactlessly measuring the flatness, step heights and parallelism of large surfaces and structures – on almost all materials.

Large-Area Measuring Systems

White-light interferometers are the ideal solution if you want to measure precision-made surfaces in the research lab, in production and in challenging environments, such as production control.

TMS-150 TopMap Metro.Lab

Being a complete measuring station, the TopMap Metro.Lab is ideally suited to large-area topographies on almost all surfaces. Since it offers great value for money, it is also attractive for smaller companies with fewer tasks.

TMS-350 TopMap In.Line

The TopMap In.Line’s compact design means it can be easily integrated into the production line and quickly carries out checks on differently reflective surfaces. Steps, larger ripples or other surface structures do not pose any problems here.

TMS-500 TopMap Pro.Surf

Ideal for quick and precise 3D surface characterization. The areal measurement ensures that no details are overlooked. Short measuring times and a large field-of-view characterize the TopMap Pro.Surf.

TMS-500-R TopMap Pro.Surf+

The new all-in-one system from Polytec. The precision of a white-light interferometer, complemented by chromatic confocal sensors to overcome form deviations and any roughness determined with one device. Pro.Surf+ measures topography over a large area and, in so doing, characterizes structures with nanometer resolution.