Measure Flatness, Roughness, Step-Height, Parallelism, Texture, Finish, & Much More!

Versatile and Innovative Optical Metrology Solutions for Surface Topography. Find out more today!

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Why Use Non-Contact Profilometers?

In order to characterise precision-manufactured and other sophisticated surfaces, measurement technology that is reliable, quick, and application-oriented is needed. Guaranteeing functionality and detecting defects at an early stage avoids unnecessary costs and increases the overall product quality and lifetime. 

Why Polytec?

USE OUR
ENGINEERS

Experienced application engineers are available to perform your measurement tasks

RENT, LEASE, OR PURCHASE

Rent or use our testing services for short notice, time critical, or occasional measurements

EVALUATE BEFORE PURCHASE

Evaluate Polytec’s solution before the final purchase decision

CHOOSE YOUR TEST LOCATION

Convenient testing at either your facility or in one of several Polytec labs

GET THE LATEST TECHNOLOGY

Access to the latest non-contact measurement technology

Which Industries Can Benefit?

Surface Metrology Products

The Polytec TopMap optical surface metrology family includes innovative, high-precision and non-contact measurement systems which are based on the principle of white-light interferometry, also called coherent or vertical scanning interferometry. Thanks to the large vertical range and nanometer resolution, they are perfect for measuring the flatness, step heights and parallelism of large surfaces and structures – on almost all materials.

LARGE-AREA MEASURING SYSTEMS

White-light interferometers are the ideal solution if you want to measure precision-made surfaces in the research lab, in production and in challenging environments, such as production control.

MICROSCOPE-BASED SYSTEMS

Thanks to the microscopic light beam path, with these Polytec models you can get the resolution of even the finest lateral details on microstructures. The process is very simple and user-friendly.

POINT SENSORS

In production lines, Polytec’s point sensors offer integrated measurement of distance and thickness, even on transparent test objects, as well as allowing you to determine the micro or nano topography and measure roughness.

SOFTWARE

In addition to an intuitive operation of the topography measurement systems, the TMS measurement and analysis software enables easy filtering and analysing of your measurement data. For the automated analysis of routine measurement tasks, the open software architecture also offers an application-specific and user-configurable interface.

MEASUREMENT SERVICES

The range of Polytec services available allows anyone to characterise surfaces of precision engineered products using our engineering services and system rentals. That way, you can make use of our ultra-modern measuring technology without investing in your own instrument. We can also offer you our customer training sessions and application support services.

Learn More About Our Laser Solutions for Research & Production Today.

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