TopMap µ.Lab

3D microscopic surface characterization with astonishing subnanometer resolution

Microscopic surface characterization sub-nm resolution

With the TopMap µ.Lab measuring microscoope, you characterize microstructure surfaces with a very high lateral resolution. This optical profilometer determines parameters such as texture, flatness, ripple and roughness on both fine and sensitive structures, microstructures and MEMS. The Polytec Smart Surface Scanning technology even measures areas of a surface with different reflectivities.

Optical measuring microsope for surface analysis

Individual images are stitched together with ease using an optional, motorized XY positioning stage. It is even possible to develop application-specific lenses depending on requirements, such as longer stand-off distances or glass compensation.

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