TopMap QC Package
Accessories and upgrade options for surface quality inspections in production environments
Surface-metrology











For surface quality inspections in production
Industrial production benefits from tightly integrating surface metrology into the manufacturing process. With such tight integration, the inspection feedback allows immediate and cost-efficient control responses. Polytec’s TopMap surface metrology systems are designed to monitor manufacturing processes, assuring that production tolerances and process capabilities are met.
Reduce rejection rates – increase process capability
A whole new package of smart features for quality control tasks are now available for the TopMap 3D surface profiling systems - the TopMap QC Package supports surface inspections especially in challenging production environments.
- The QC Verifier avoids false rejects in challenging production environments by compensating for environmental disturbances that impact the precision measurement.
- The QC Software Customization provides for application-specific adaptations in software and easy integration of inline measurements.
- The QC Operator Interface offers simple one-click solutions at production level thanks to pre-defined measurement recipes.
- The QC Setting Comparator helps achieve global standardization with simplified monitoring of measurement settings and fast diagnostics.
- The QC Protection Housing provides significant resistance to rough production environments.
- The QC Barcode Scanner simplifies loading the right settings and avoids operator failures.
- Avoid false rejects in challenging production environments with the innovative ECT Environmental Compensation Technology
- Time-saving motorized tip-tilt unit for precise sample positioning
- Simple one-click solutions avoid operator failures and save time
- Achieve and monitor global quality standards
- Protect measurements in rough production environments
- Simplified loading of settings saves time
- Ask for customized software to meet your individual needs
TopMap optical surface metrology using ECT Environmental Compensation Technology
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