Measure Surfaces with Nanometer Precision

Polytec’s optical surface metrology range includes innovative, high-precision and non-contact tools. They are based on the principle of white-light interferometry, which is also known as coherent or vertical scanning interferometry or coherence radar. Thanks to their large vertical range and nanometer resolution, they are perfect for contactlessly measuring the flatness, step heights and parallelism of large surfaces and structures – on almost all materials.

Point Sensors

In production lines, Polytec’s point sensors offer integrated measurement of distance and thickness, even on transparent test objects, as well as allowing you to determine the microtopography/nanotopography and measure roughness.


Polytec’s configurable, chromatic confocal sensors of the TopSens series enable fast quality inspections in-line.