Optical surface profilers

Optical surface profilers from Polytec are innovative, high-precision and non-contact tools for characterizing the surface topography in 3D. They are based on the principle of white-light interferometry, which is also known as coherent or vertical scanning interferometry or coherence radar. Thanks to their large vertical range, nanometer resolution and areal measurement, they are perfect for contactlessly measuring the flatness, step height and parallelism of large sample structures – on almost every material.

Point Sensors

In production lines, Polytec’s point sensors offer integrated measurement of distance and thickness, even on transparent test objects, as well as allowing you to determine the microtopography/nanotopography and measure roughness.


Polytec’s configurable, chromatic confocal sensors of the TopSens series enable fast quality inspections in-line.