Microscope-Based Systems

Thanks to the microscopic light beam path, with these Polytec models you can get the resolution of even the finest lateral details on microstructures. The process is very simple and user-friendly.

TopMap µ.Lab

With the TMS-1200 TopMap µ.Lab, you can characterize microstructures’ surfaces with a very high lateral resolution. The optical profilometer contactlessly determines parameters such as texture, flatness, ripple and roughness on both fine and sensitive structures. The Polytec Smart Surface scanning technology even measures areas of a surface with different reflectivities.